WEPH33
DESY, Hamburg, Germany
THOPMA03
DESY, Hamburg, Germany
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WEPH33 |
Challenges for Nanopositioning | |
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| In nanopositioning systems there are plenty of disturbance sources corrupting the stability of the positioners and optics. Vibrations are induced by machines like pumps and coolers, as well as by car traffic hundreds of meters far from the facility. Furthermore the small and lightweight mechanical components are strongly influenced by sound waves. The positioners themselves may also produce vibrations or at least amplify them by the eigenfrequencies of their flexure joints, which are used for nanometer positioning accuracy without backlash. To identify the sources, amplification and damping of vibrations inside the setup, different kinds of measurements, including broadband frequency stimulation, have been performed on a setup at a nano experimental hutch of a PETRA III Beamline. Therefore some mechanical components and positioning stages were changed against stiffer materials to have comparable measurements to get statements about the quality of the mechanical properties. The poster shows the experimental setup, the measuring methods and some comparing vibration plots, which give information about the identified mechanical behavior. | ||
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Poster WEPH33 [1.591 MB] | |
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THOPMA03 |
PtyNAMi: Ptychographic Nano-Analytical Microscope at PETRA III -How to Achieve Sub-nanometer Sample Stability | |
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| In recent years, ptychography has been established as a method in X-ray microscopy to achieve a spatial resolution even below the diffraction limit of x-ray optics, down to a few nm. This requires, among other things, an extremely high degree of mechanical stability, a low background signal from the x-ray microscope and highest demands on the beam guiding and focusing optics. PtyNAMi is the new generation hard x-ray scanning microscope at beamline P06 of PETRA III at DESY combining a sample scanner designed for maximal stability, a new detector system designed to reduce background signals, and an interferometric position control of sample and X-ray optics. The interferometer system enables tracking the sample position relative to the optics in scanning microscopy and tomography on all relevant time scales. This is crucial for high-resolution scanning x-ray microscopy to track vibrations and long-term drifts in the noisy environment of a synchrotron radiation source in user operation. We present the design concept in detail with a special focus on real-time metrology of the sample position during 3D x-ray scanning microscopy using a ball-lens retroreflector. | ||
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Slides THOPMA03 [19.686 MB] | |
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