Author: Tuggle, J.
Paper Title Page
MOPLR023 Examination of Cutouts Inner Surfaces from Nb3Sn Coated Cavity 189
 
  • U. Pudasaini, M.J. Kelley
    The College of William and Mary, Williamsburg, Virginia, USA
  • G.V. Eremeev, C.E. Reece
    JLab, Newport News, Virginia, USA
  • J. Tuggle
    Virginia Polytechnic Institute and State University, Blacksburg, USA
 
  Funding: Supported by the U.S. Department of Energy, Office of Science, Office of Nuclear Physics under contract DE-AC05-06OR23177 and Office of High Energy Physics under grant SC00144475.
The potential for higher operating temperature and higher gradient have motivated SRF cavity researchers to pursue Nb3Sn as an alternative to Nb for nearly fifty years. Far and away the most common embodiment has been a few micron-thick Nb3Sn layer on the cavity interior surface obtained by vapor diffusion coating, with one or another set of parameters. While many cavities have been made and RF tested, reports of dissecting a cavity in detail to examine the coating and relate it to RF measurements are rare. We coated a BCP-treated single cell cavity in a typical process of tin/tin chloride activation at 500 C followed by tin vapor deposition at 1200 C. After RF-testing, we cut and examined sections from several locations to learn composition, thickness topography of the interior surface. The effect of process variables, such as surface preparation, process temperature and duration, and vapor chemistry needs to be explored.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-LINAC2016-MOPLR023  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)  
 
MOPLR025 Investigation of Low-Level Nitrogen in Niobium by Secondary Ion Mass Spectrometry 196
 
  • J. Tuggle
    Virginia Polytechnic Institute and State University, Blacksburg, USA
  • M.J. Kelley
    The College of William and Mary, Williamsburg, Virginia, USA
  • A.D. Palczewski, C.E. Reece
    JLab, Newport News, Virginia, USA
  • F.A. Stevie
    NCSU AIF, Raleigh, North Carolina, USA
 
  Funding: Supported by the U.S. DOE Office of Science, ONP contract DE-AC05-06OR23177 and OHEP grant SC00144475. Tuggle is supported by Nanoscale Characterization and Fabrication Laboratory at Virginia Tech.
Understanding the improvement of the SRF cavity quality factor by low-level nitrogen addition ("N-doping") is attracting much attention from researchers. Precise, repeatable measurement of the nitrogen profile in the parts-per-thousand to parts-per-million range is vital. Secondary Ion Mass Spectrometry (SIMS) is the approach of choice because of excellent sensitivity and depth resolution. Accurate quantitation must consider sample properties, such as surface topography and crystal structure, calibration of the instrument with reference materials, and data analysis. We report the results of a SIMS study in which polycrystal and single crystal coupons were N-doped, each accompanied by new SRF-grade niobium sheet equivalent to a single cell cavity.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-LINAC2016-MOPLR025  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)  
 
THOP02 Investigation of Nitrogen Absorption Rate and Nitride Growth on SRF Cavity Grade RRR Niobium as a Function of Furnace Temperature 744
THPRC003   use link to see paper's listing under its alternate paper code  
 
  • A.D. Palczewski, C.E. Reece
    JLab, Newport News, Virginia, USA
  • M.J. Kelley
    The College of William and Mary, Williamsburg, Virginia, USA
  • J. Tuggle
    Virginia Polytechnic Institute and State University, Blacksburg, USA
 
  Funding: Notice: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
The current state of the art processing of niobium superconducting radio frequency cavities with nitrogen diffusion is performed at 800C in a furnace with a partial pressure of approximately ~20 mtorr of nitrogen. Multiple studies have shown the bulk of the nitrogen absorbed by the niobium forms a thick (1-3 microns) non-superconducting nitride layer which must be removed to produce optimal RF results. The depth profiling of interstitial nitrogen and surface nitrides has already been probed using SIMS measurements. These measurements have also been modeled by extrapolating data from nitride growth studies performed at atmospheric pressure and temperatures above 1000 C (**). One open question is whether there is a diffusion zone at lower temperature in which the niobium will absorb nitrogen but not create a non-superconducting nitride layer; or is the absorption of nitrogen only possible by first forming a nitride buffer layer which then frees up nitrogen for absorption. A systematic study of absorption rate vs. temperature and correlated SIMS measurements needs to be performed to answer this question. We report on the absorption rate vs. temperature from 400 C to 900 C of cavity grade niobium with metallurgically flat witness samples. The witness samples surface depth profile of NbN via SIMS's will be presented and correlated to the absorption.**
* Gonnella et al., Proceedings of SRF2015 Pre-release MOPB042 (2015)
** Tuggle et al., Investigation of Low-Level Nitrogen in Niobium by Secondary Ion Mass Spectrometry, these proceedings (2016)
 
poster icon Poster THOP02 [2.235 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-LINAC2016-THOP02  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)