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RIS citation export for MOPLR025: Investigation of Low-Level Nitrogen in Niobium by Secondary Ion Mass Spectrometry

TY - CONF
AU - Tuggle, J.
AU - Kelley, M.J.
AU - Palczewski, A.D.
AU - Reece, C.E.
AU - Stevie, F.A.
ED - Yamazaki, Yoshishige
ED - Facco, Alberto
ED - McCausey, Amy
ED - Schaa, Volker RW
TI - Investigation of Low-Level Nitrogen in Niobium by Secondary Ion Mass Spectrometry
J2 - Proc. of LINAC2016, East Lansing, MI, USA, 25-30 September 2016
C1 - East Lansing, MI, USA
T2 - Linear Accelerator Conference
T3 - 28
LA - english
AB - Understanding the improvement of the SRF cavity quality factor by low-level nitrogen addition ("N-doping") is attracting much attention from researchers. Precise, repeatable measurement of the nitrogen profile in the parts-per-thousand to parts-per-million range is vital. Secondary Ion Mass Spectrometry (SIMS) is the approach of choice because of excellent sensitivity and depth resolution. Accurate quantitation must consider sample properties, such as surface topography and crystal structure, calibration of the instrument with reference materials, and data analysis. We report the results of a SIMS study in which polycrystal and single crystal coupons were N-doped, each accompanied by new SRF-grade niobium sheet equivalent to a single cell cavity.
PB - JACoW
CP - Geneva, Switzerland
SP - 196
EP - 198
KW - ion
KW - niobium
KW - SRF
KW - cavity
KW - factory
DA - 2017/05
PY - 2017
SN - 978-3-95450-169-4
DO - 10.18429/JACoW-LINAC2016-MOPLR025
UR - http://jacow.org/linac2016/papers/moplr025.pdf
ER -