LINAC2016 - List of Authors (Stevie, F.A.)

Paper	Title	Page
MOPLR025	Investigation of Low-Level Nitrogen in Niobium by Secondary Ion Mass Spectrometry	196
	J. Tuggle Virginia Polytechnic Institute and State University, Blacksburg, USA M.J. Kelley The College of William and Mary, Williamsburg, Virginia, USA A.D. Palczewski, C.E. Reece JLab, Newport News, Virginia, USA F.A. Stevie NCSU AIF, Raleigh, North Carolina, USA
	Funding: Supported by the U.S. DOE Office of Science, ONP contract DE-AC05-06OR23177 and OHEP grant SC00144475. Tuggle is supported by Nanoscale Characterization and Fabrication Laboratory at Virginia Tech. Understanding the improvement of the SRF cavity quality factor by low-level nitrogen addition ("N-doping") is attracting much attention from researchers. Precise, repeatable measurement of the nitrogen profile in the parts-per-thousand to parts-per-million range is vital. Secondary Ion Mass Spectrometry (SIMS) is the approach of choice because of excellent sensitivity and depth resolution. Accurate quantitation must consider sample properties, such as surface topography and crystal structure, calibration of the instrument with reference materials, and data analysis. We report the results of a SIMS study in which polycrystal and single crystal coupons were N-doped, each accompanied by new SRF-grade niobium sheet equivalent to a single cell cavity.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-LINAC2016-MOPLR025
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Paper

Title

Page

Investigation of Low-Level Nitrogen in Niobium by Secondary Ion Mass Spectrometry

196

J. Tuggle
Virginia Polytechnic Institute and State University, Blacksburg, USA
M.J. Kelley
The College of William and Mary, Williamsburg, Virginia, USA
A.D. Palczewski, C.E. Reece
JLab, Newport News, Virginia, USA
F.A. Stevie
NCSU AIF, Raleigh, North Carolina, USA

Funding: Supported by the U.S. DOE Office of Science, ONP contract DE-AC05-06OR23177 and OHEP grant SC00144475. Tuggle is supported by Nanoscale Characterization and Fabrication Laboratory at Virginia Tech.
Understanding the improvement of the SRF cavity quality factor by low-level nitrogen addition ("N-doping") is attracting much attention from researchers. Precise, repeatable measurement of the nitrogen profile in the parts-per-thousand to parts-per-million range is vital. Secondary Ion Mass Spectrometry (SIMS) is the approach of choice because of excellent sensitivity and depth resolution. Accurate quantitation must consider sample properties, such as surface topography and crystal structure, calibration of the instrument with reference materials, and data analysis. We report the results of a SIMS study in which polycrystal and single crystal coupons were N-doped, each accompanied by new SRF-grade niobium sheet equivalent to a single cell cavity.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-LINAC2016-MOPLR025

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)