Author: Du, Y.
Paper Title Page
MOPAB361 Threshold in Filling Failure of RF Cavity Caused by Beam Loading in Multipactor 1122
 
  • J. Pang
    USTC/NSRL, Hefei, Anhui, People’s Republic of China
  • Y. Dong
    Institute of Applied Physics and Computational Mathematics, People’s Republic of China
  • Y. Du
    Institute of Fluid Physics,, China Academy of Engineering Physics, Mianyang, People’s Republic of China
 
  Funding: NSFC
A pulsed RF cavity would be heavily detuned caused by beam loading of multipactor current in the RF filling process. Multipactor zone would be expended by several times than that in static states with assumptions of fixed voltage and no beam loading. The dynamic of multipactor in the RF filling process was simulated by coupling with parameters of external circuit with the developed simulation code, and test in experiments with a parallel-plate resonator. Threshold of RF voltage, which means the lower boundary of peak voltage of multipactor zone, had been quantified with different cavity parameters. When we increased the gap length, the measured threshold became larger due to the ionization in background gas. Then the secondary emission factor would be increased in simulation for consistence with the experiment results. Additionally, some multipactor phenomenon could not be predicted precisely because the simulation code did not take account of ionization. The hysteresis of phase and energy of ionization electrons would be a new driving factor for the growth of multipactor in certain conditions.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2021-MOPAB361  
About • paper received ※ 19 May 2021       paper accepted ※ 24 May 2021       issue date ※ 10 August 2021  
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