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TY - CONF AU - Pang, J. AU - Dong, Y. AU - Du, Y. ED - Liu, Lin ED - Byrd, John M. ED - Neuenschwander, Regis T. ED - Picoreti, Renan ED - Schaa, Volker R. W. TI - Threshold in Filling Failure of RF Cavity Caused by Beam Loading in Multipactor J2 - Proc. of IPAC2021, Campinas, SP, Brazil, 24-28 May 2021 CY - Campinas, SP, Brazil T2 - International Particle Accelerator Conference T3 - 12 LA - english AB - A pulsed RF cavity would be heavily detuned caused by beam loading of multipactor current in the RF filling process. Multipactor zone would be expended by several times than that in static states with assumptions of fixed voltage and no beam loading. The dynamic of multipactor in the RF filling process was simulated by coupling with parameters of external circuit with the developed simulation code, and test in experiments with a parallel-plate resonator. Threshold of RF voltage, which means the lower boundary of peak voltage of multipactor zone, had been quantified with different cavity parameters. When we increased the gap length, the measured threshold became larger due to the ionization in background gas. Then the secondary emission factor would be increased in simulation for consistence with the experiment results. Additionally, some multipactor phenomenon could not be predicted precisely because the simulation code did not take account of ionization. The hysteresis of phase and energy of ionization electrons would be a new driving factor for the growth of multipactor in certain conditions. PB - JACoW Publishing CP - Geneva, Switzerland SP - 1122 EP - 1124 KW - multipactoring KW - cavity KW - simulation KW - electron KW - experiment DA - 2021/08 PY - 2021 SN - 2673-5490 SN - 978-3-95450-214-1 DO - doi:10.18429/JACoW-IPAC2021-MOPAB361 UR - https://jacow.org/ipac2021/papers/mopab361.pdf ER -