IPAC2019 - List of Authors (Gordon, M.A.)

Paper	Title	Page
WEPTS069	The Effects of Stochastic Space Charge in High Brightness Photolectron Beamlines for Ultrafast Electron Diffraction	3283
SUSPFO124	use link to see paper's listing under its alternate paper code
	M.A. Gordon, Y.K. Kim University of Chicago, Chicago, Illinois, USA J.M. Maxson Cornell University, Ithaca, New York, USA J.M. Maxson Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
	Funding: This work was supported by the U.S. National Science Foundation under award PHY-1549132, the Center for Bright Beams. As we move to ultra-high brightness photocathodes and ultra-cold beams, we may become more sensitive to stochastic, point-to point effects such as disorder induced heating and the Boersch effect, given the failure of Debye screening. In this study, we explore the effects of stochastic scattering. Modern beam dynamics codes often approximate point to point interactions with a potential created by smoothing the charge over space, removing sensitivity to stochastic effects. This approximation is often used in beamline optimization, because it is much faster. We study the limits of validity of this approximation. In particular, we will simulate effects of stochastic space charge on a high brightness photoemission beamline, an ultrafast electron diffraction beamline with a photocathode temperature of 5 meV with a final beam energy of 225 keV. Emittance dilution in the transverse plane and transverse beam size relative to smooth space charge simulations will be presented.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2019-WEPTS069
About •	paper received ※ 13 May 2019 paper accepted ※ 22 May 2019 issue date ※ 21 June 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

WEPTS069

The Effects of Stochastic Space Charge in High Brightness Photolectron Beamlines for Ultrafast Electron Diffraction

3283

SUSPFO124

use link to see paper's listing under its alternate paper code

M.A. Gordon, Y.K. Kim
University of Chicago, Chicago, Illinois, USA
J.M. Maxson
Cornell University, Ithaca, New York, USA
J.M. Maxson
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA

Funding: This work was supported by the U.S. National Science Foundation under award PHY-1549132, the Center for Bright Beams.
As we move to ultra-high brightness photocathodes and ultra-cold beams, we may become more sensitive to stochastic, point-to point effects such as disorder induced heating and the Boersch effect, given the failure of Debye screening. In this study, we explore the effects of stochastic scattering. Modern beam dynamics codes often approximate point to point interactions with a potential created by smoothing the charge over space, removing sensitivity to stochastic effects. This approximation is often used in beamline optimization, because it is much faster. We study the limits of validity of this approximation. In particular, we will simulate effects of stochastic space charge on a high brightness photoemission beamline, an ultrafast electron diffraction beamline with a photocathode temperature of 5 meV with a final beam energy of 225 keV. Emittance dilution in the transverse plane and transverse beam size relative to smooth space charge simulations will be presented.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2019-WEPTS069

About •

paper received ※ 13 May 2019 paper accepted ※ 22 May 2019 issue date ※ 21 June 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)