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TY - CONF AU - Gordon, M.A. AU - Kim, Y.K. AU - Maxson, J.M. ED - Boland, Mark ED - Tanaka, Hitoshi ED - Button, David ED - Dowd, Rohan ED - Schaa, Volker RW ED - Tan, Eugene TI - The Effects of Stochastic Space Charge in High Brightness Photolectron Beamlines for Ultrafast Electron Diffraction J2 - Proc. of IPAC2019, Melbourne, Australia, 19-24 May 2019 CY - Melbourne, Australia T2 - International Particle Accelerator Conference T3 - 10 LA - english AB - As we move to ultra-high brightness photocathodes and ultra-cold beams, we may become more sensitive to stochastic, point-to point effects such as disorder induced heating and the Boersch effect, given the failure of Debye screening. In this study, we explore the effects of stochastic scattering. Modern beam dynamics codes often approximate point to point interactions with a potential created by smoothing the charge over space, removing sensitivity to stochastic effects. This approximation is often used in beamline optimization, because it is much faster. We study the limits of validity of this approximation. In particular, we will simulate effects of stochastic space charge on a high brightness photoemission beamline, an ultrafast electron diffraction beamline with a photocathode temperature of 5 meV with a final beam energy of 225 keV. Emittance dilution in the transverse plane and transverse beam size relative to smooth space charge simulations will be presented. PB - JACoW Publishing CP - Geneva, Switzerland SP - 3283 EP - 3285 KW - space-charge KW - simulation KW - electron KW - emittance KW - cathode DA - 2019/06 PY - 2019 SN - 978-3-95450-208-0 DO - DOI: 10.18429/JACoW-IPAC2019-WEPTS069 UR - http://jacow.org/ipac2019/papers/wepts069.pdf ER -