Title |
The Effects of Stochastic Space Charge in High Brightness Photolectron Beamlines for Ultrafast Electron Diffraction |
Authors |
- M.A. Gordon, Y.K. Kim
University of Chicago, Chicago, Illinois, USA
- J.M. Maxson
Cornell University, Ithaca, New York, USA
- J.M. Maxson
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
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Abstract |
As we move to ultra-high brightness photocathodes and ultra-cold beams, we may become more sensitive to stochastic, point-to point effects such as disorder induced heating and the Boersch effect, given the failure of Debye screening. In this study, we explore the effects of stochastic scattering. Modern beam dynamics codes often approximate point to point interactions with a potential created by smoothing the charge over space, removing sensitivity to stochastic effects. This approximation is often used in beamline optimization, because it is much faster. We study the limits of validity of this approximation. In particular, we will simulate effects of stochastic space charge on a high brightness photoemission beamline, an ultrafast electron diffraction beamline with a photocathode temperature of 5 meV with a final beam energy of 225 keV. Emittance dilution in the transverse plane and transverse beam size relative to smooth space charge simulations will be presented.
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Funding |
This work was supported by the U.S. National Science Foundation under award PHY-1549132, the Center for Bright Beams. |
Paper |
download WEPTS069.PDF [0.474 MB / 3 pages] |
Export |
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Conference |
IPAC2019 |
Series |
International Particle Accelerator Conference (10th) |
Location |
Melbourne, Australia |
Date |
19-24 May 2019 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Mark Boland (UoM, Saskatoon, SK, Canada); Hitoshi Tanaka (KEK, Tsukuba, Japan); David Button (ANSTO, Kirrawee, NSW, Australia); Rohan Dowd (ANSTO, Kirrawee, NSW, Australia); Volker RW Schaa (GSI, Darmstadt, Germany); Eugene Tan (ANSTO, Kirrawee, NSW, Australia) |
Online ISBN |
978-3-95450-208-0 |
Received |
13 May 2019 |
Accepted |
22 May 2019 |
Issue Date |
21 June 2019 |
DOI |
doi:10.18429/JACoW-IPAC2019-WEPTS069 |
Pages |
3283-3285 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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