Keyword: pulsed-power
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WEPVA063 Development of a New Pulsed Power Supply with the SiC-MOSFET power-supply, kicker, flattop, operation 3412
 
  • T. Takayanagi, K. Horino, J. Kamiya, M. Kinsho, T. Ueno, K. Yamamoto
    JAEA/J-PARC, Tokai-mura, Japan
  • Y. Mushibe, A. Tokuchi
    Pulsed Power Japan Laboratory Ltd., Kusatsu-shi Shiga, Japan
 
  A new power sup­ply has been de­vel­oped using lin­ear trans­former dri­ver (LTD) tech­nol­ogy that adopts SiC-MOS­FETs and ca­pac­i­tors with­out a thyra­tron switch or a pulse form­ing net­work (PFN) de­vice. A new power sup­ply was also de­signed by con­nect­ing the SiC-MOS­FETs and the LTD mod­ules in par­al­lel-se­ries. The out­put volt­age and cur­rent were 40 kV and 4 kA, re­spec­tively with a pulse width of 1500 nsec at a rep­e­ti­tion rate of 25 Hz. Fur­ther­more, by ad­just­ing the cor­rec­tion mod­ule, to an out­put volt­age per stage of 1/1000, a res­o­lu­tion of the volt­age cor­rec­tion of ±0.1 % could be achieved. It was pos­si­ble to out­put the cur­rent with ar­bi­trary tim­ing by using a trig­ger input for each LTD mod­ule. As a re­sult, fine ad­just­ment of the out­put volt­age wave­form was pos­si­ble within the order of nanosec­onds. This new power sup­ply with high volt­age out­put, cur-rent out­put, and very fast pulse op­er­a­tion is one of the most im­por­tant key tech­nolo­gies for a kicker sys­tem using SiC-MOS­FETs. The de­sign and pre­lim­i­nary test re­sults of this pro­to­type power sup­ply are pre­sented here.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-WEPVA063  
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THPIK096 Jitter Measurement to 10ppm Level for Pulsed RF Power Amplifiers 3 - 12GHz operation, timing, hardware, kicker 4314
 
  • C.H. Gough, S. Dordevic, M. Paraliev
    PSI, Villigen PSI, Switzerland
 
  Linacs for FEL ap­pli­ca­tions re­quire a low jit­ter RF path from RF source through pulsed am­pli­fiers, kly­stron / mod­u­la­tors and cav­i­ties. For the Swiss­FEL pro­ject, pulsed solid state power am­pli­fiers of the 500W / 3us class for dri­ving the kly­strons were re­quired. For these am­pli­fiers, a sta­ble and re­li­able in­ter­fer­om­e­ter sys­tem was de­vel­oped to mea­sure the resid­ual RF jit­ter lev­els to <10 ppm (parts per mil­lion) and <10 urad (0.6mdeg) rms. This paper de­scribes the sys­tem and gives some mea­sure­ment re­sults for 3GHz, 5.7GHz and 12GHz am­pli­fiers.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-THPIK096  
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