Paper | Title | Page |
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TUPAB083 | Commissioning Experience and Beam Optimization for DCLS Linac | 1509 |
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Dalian Coherent Light Source (DCLS), which will focus on the Physical Chemistry with time-resolved pump-probe experiments and EUV absorption spectroscopy techniques, is the first high gain FEL user facility in China. The 300MeV linac consists of a laser-driven rf-gun followed by 7 Sband accelerating tubes. A magnetic chicane is adopted to get the desired 300A peak current. After 5 months component installation, first photoelectrons were generated on 17 August 2016. In this paper, we give a summary of the commissioning experience and the beam parameters measurements. In addition, beam jitter sources are studied based on real machine performances. | ||
DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-TUPAB083 | |
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TUPAB084 | Beam Stability Modeling and Jitter Control for SXFEL Linac | 1513 |
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FEL operations foresee stringent requirements for the stability of the global linac output parameters and this requirement is particularly stringent for the successful operation of an externally seeded FEL. In order to understand the sensitivity of these parameters to jitters of various error sources along the SXFEL linac, studies have been performed based on analytical methods and tracking code simulations. Using the tolerance budget as guidance, beam jitter control techniques are discussed on the view of the beam dynamics. | ||
DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-TUPAB084 | |
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TUPIK069 | PXIe Embedded Control Station Based the Electric Breakdown Data Acquisition and RF Conditioning System for C-Band Accelerating Structures Using for Shanghai Soft X-Ray Free Electron Laser (SXFEL) | 1855 |
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Funding: Shanghai Institute of Applied Physics, The Chinese Academy of Science., National Development and Reform Commission, the People's Republic of China., National Natural Science Foundation of China. Shanghai Soft X-Ray Free Electron Laser (SXFEL) adopts C-band structure to accelerate the electron to 1.5-GeV. Due to high gradient operation, the electric breakdown and structure conditioning problems need to be perfectly resolved. For this purpose, we develop an automatic conditioning control and electric breakdown data acquisition system. The control based on a PXI Express (PXIe) embedded frame and the LabView-FPGA technique. The prototype system design, the software programming and hardware test will be introduced. The experiment setup and test results for a low-level signal will be shown. ' Corresponding author: liyingmin@sinap.ac.cn |
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DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-TUPIK069 | |
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THPIK067 | A C-Band Compact Spherical RF Pulse Compressor for the SXFEL Linac Energy Upgrade | 4248 |
SUSPSIK094 | use link to see paper's listing under its alternate paper code | |
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A new compact C-band (5712 MHz) spherical RF pulse compressor has been designed for Shanghai Soft X-ray Free Electron Laser (SXFEL) facility energy upgrading at Shanghai Institute of Applied Physics (SINAP), Chinese Academy of Sciences (CAS). This pulse compressor contains one high Q0 spherical RF resonant cavity which works on two TE113 modes and a novel coupler. As there is only one storage cavity, this pulse compressor can be much smaller than the traditional SLED. With the coupling coefficient 4.9, the average power gain can be as high as 3.8. In this paper, the scheme of the C-band spherical pulse compressor and RF design are presented. | ||
DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-THPIK067 | |
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THPIK068 | High Power Test of SINAP X-Band Deflector at KEK | 4251 |
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A crucial RF structure used for bunch length measurement for Shanghai X-ray Free Electron Lasers (SXFEL) at the Shanghai Institute of Applied Physics (SINAP), Chinese Academy of Science [1]. The design, fabrication, measurement and tuning have been completed at SINAP [2], and the high power test was carried out at Nextef of KEK with international collaboration. This paper presents the RF conditioning process and test results. | ||
DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-THPIK068 | |
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