IPAC2017 - List of Authors (Fung, H.K.)

Paper	Title	Page
TUPAB128	Single Photoemitter Tips in a DC Gun: Limiting Aberration-induced Emittance	1622
	I.V. Bazarov, L. Cultrera, C.M. Gulliford, H. Lee Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA H.K. Fung Cornell University, Ithaca, New York, USA J.M. Maxson UCLA, Los Angeles, California, USA
	Ultrafast electron diffraction (UED) offers unique advantages over x-ray diffraction, like stronger scattering cross-section, versatility in sample types and ability to offer smaller apparatus foot print. There is a growing need to increase brightness of electron beams especially for single-shot UED applications. We explore the utilization of field enhancement from a micron-scale single tip inside a DC gun to obtain brighter sub-pC electron beams using a nominal cathode electric field of several MV/m. The additional field enhancement can place moderate voltage sources on par with the highest gradient devices and allow improved performance presently not possible in the existing photoemission guns.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-TUPAB128
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Paper

Title

Page

Single Photoemitter Tips in a DC Gun: Limiting Aberration-induced Emittance

1622

I.V. Bazarov, L. Cultrera, C.M. Gulliford, H. Lee
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
H.K. Fung
Cornell University, Ithaca, New York, USA
J.M. Maxson
UCLA, Los Angeles, California, USA

Ultrafast electron diffraction (UED) offers unique advantages over x-ray diffraction, like stronger scattering cross-section, versatility in sample types and ability to offer smaller apparatus foot print. There is a growing need to increase brightness of electron beams especially for single-shot UED applications. We explore the utilization of field enhancement from a micron-scale single tip inside a DC gun to obtain brighter sub-pC electron beams using a nominal cathode electric field of several MV/m. The additional field enhancement can place moderate voltage sources on par with the highest gradient devices and allow improved performance presently not possible in the existing photoemission guns.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-TUPAB128

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)