The Joint Accelerator Conferences Website (JACoW) is an international collaboration that publishes the proceedings of accelerator conferences held around the world.
TY - CONF AU - Bazarov, I.V. AU - Cultrera, L. AU - Fung, H.K. AU - Gulliford, C.M. AU - Lee, H. AU - Maxson, J.M. ED - Schaa, Volker RW ED - Arduini, Gianluigi ED - Pranke, Juliana ED - Seidel, Mike ED - Lindroos, Mats TI - Single Photoemitter Tips in a DC Gun: Limiting Aberration-induced Emittance J2 - Proc. of IPAC2017, Copenhagen, Denmark, 14â19 May, 2017 C1 - Copenhagen, Denmark T2 - International Particle Accelerator Conference T3 - 8 LA - english AB - Ultrafast electron diffraction (UED) offers unique advantages over x-ray diffraction, like stronger scattering cross-section, versatility in sample types and ability to offer smaller apparatus foot print. There is a growing need to increase brightness of electron beams especially for single-shot UED applications. We explore the utilization of field enhancement from a micron-scale single tip inside a DC gun to obtain brighter sub-pC electron beams using a nominal cathode electric field of several MV/m. The additional field enhancement can place moderate voltage sources on par with the highest gradient devices and allow improved performance presently not possible in the existing photoemission guns. PB - JACoW CP - Geneva, Switzerland SP - 1622 EP - 1625 KW - emittance KW - electron KW - cathode KW - laser KW - cryogenics DA - 2017/05 PY - 2017 SN - 978-3-95450-182-3 DO - 10.18429/JACoW-IPAC2017-TUPAB128 UR - http://jacow.org/ipac2017/papers/tupab128.pdf ER -