Author: Mead, J.
Paper Title Page
MOPMR057 Measurements using Button BPM SUM Signal 377
 
  • W.X. Cheng, K. Ha, J. Mead, O. Singh, G.M. Wang
    BNL, Upton, Long Island, New York, USA
 
  Modern digital BPM detectors measure not only the beam positions, four buttons SUM signal can be very helpful for machine developments and operations. At NSLS-II, BPM SUM signal has been used from commissioning stage, to investigate localized beam losses. During top-off operation, precise beam lifetime measurement within relative short period of time becomes important. With many BPMs along the ring, BPM SUM can be a much more accurate tool to measure the beam current and lifetime. BPM SUM signal shall be proportional to beam current, and it may depends on button sizes and BPM chamber geometry, cable attenuations, electronics attenuations, beam position, bunch lengths, fill pattern etc. Experience of BPM SUM signals measurements will be presented.  
DOI • reference for this paper ※ DOI:10.18429/JACoW-IPAC2016-MOPMR057  
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WEOBB01 Single Micron Single-Bunch Turn-by-Turn BPM Resolution Achieved at NSLS-II 2095
 
  • B. Podobedov, W.X. Cheng, K. Ha, Y. Hidaka, J. Mead, O. Singh, K. Vetter
    BNL, Upton, Long Island, New York, USA
 
  NSLS-II state-of-the-art BPMs provide a single micron turn-by-turn BPM resolution for any bunch train of reasonable intensity. For certain beam dynamics studies a similar, or even better, resolution is desired for a single-, or a few-bunch fill, which is not yet available with our standard BPM signal processing. This paper describes our experience with more advanced BPM ADC signal processing which allowed us to significantly improve turn-by-turn BPM resolution in single bunch mode down to the level of about one micron at ~1 nC/bunch. We also present the examples of machine studies that benefit from this BPM performance enhancement.  
slides icon Slides WEOBB01 [2.565 MB]  
DOI • reference for this paper ※ DOI:10.18429/JACoW-IPAC2016-WEOBB01  
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