Author: Chen, J.
Paper Title Page
MOPMB036 Beam Profile Measurement Using Kirkpatrick Baez Mirror Optics at Shanghai Synchrotron Radiation Facility 167
  • D.C. Zhu, J.S. Cao, Y.F. Sui, J.H. Yue
    IHEP, Beijing, People's Republic of China
  • J. Chen
    SINAP, Shanghai, People's Republic of China
  For the third-generation light sources, the vertical emit-tance of a few pico-meter-radians which can be achieved with good coupling correction close to 0.1%, will lead to very small beam size. Several microns vertical beam sizes measurement has presented challenges for diagnostic capability in this region. A few techniques have been developed to make a precise measurement, such as visible light interferometer, x-ray imaging using Fresnel zone plates, compound refractive lenses or pinhole camera. In this paper, an x-ray reflective optics method based on the Kirkpatrick'Baez mirrors will be emphasis on discussed. The K-B mirror system will be installed and tested in SSRF to obtain the vertical beam size close to 20 microns, which is expected to be used for several microns vertical beam size measurement in the future light source named HEPS (High Energy Photon Source) in China.  
DOI • reference for this paper ※ DOI:10.18429/JACoW-IPAC2016-MOPMB036  
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