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RIS citation export for MOPMB036: Beam Profile Measurement Using Kirkpatrick Baez Mirror Optics at Shanghai Synchrotron Radiation Facility

TY - CONF
AU - Zhu, D.C.
AU - Cao, J.S.
AU - Chen, J.
AU - Sui, Y.F.
AU - Yue, J.H.
ED - Petit-Jean-Genaz, Christine
ED - Kim, Dong Eon
ED - Kim, Kyung Sook
ED - Ko, In Soo
ED - Schaa, Volker RW
TI - Beam Profile Measurement Using Kirkpatrick Baez Mirror Optics at Shanghai Synchrotron Radiation Facility
J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016
C1 - Busan, Korea
T2 - International Particle Accelerator Conference
T3 - 7
LA - english
AB - For the third-generation light sources, the vertical emit-tance of a few pico-meter-radians which can be achieved with good coupling correction close to 0.1%, will lead to very small beam size. Several microns vertical beam sizes measurement has presented challenges for diagnostic capability in this region. A few techniques have been developed to make a precise measurement, such as visible light interferometer, x-ray imaging using Fresnel zone plates, compound refractive lenses or pinhole camera. In this paper, an x-ray reflective optics method based on the Kirkpatrick'Baez mirrors will be emphasis on discussed. The K-B mirror system will be installed and tested in SSRF to obtain the vertical beam size close to 20 microns, which is expected to be used for several microns vertical beam size measurement in the future light source named HEPS (High Energy Photon Source) in China.
PB - JACoW
CP - Geneva, Switzerland
SP - 167
EP - 170
KW - synchrotron
KW - radiation
KW - synchrotron-radiation
KW - optics
KW - diagnostics
DA - 2016/06
PY - 2016
SN - 978-3-95450-147-2
DO - 10.18429/JACoW-IPAC2016-MOPMB036
UR - http://jacow.org/ipac2016/papers/mopmb036.pdf
ER -