Author: Carlà, M.
Paper Title Page
MOPOR007 Local Impedance Measurements at ALBA from Turn-by-Turn Acquisition 598
  • M. Carlà, G. Benedetti, T.F.G. Günzel, U. Iriso, Z. Martí
    ALBA-CELLS Synchrotron, Cerdanyola del Vallès, Spain
  A transverse impedance source manifests itself, among other ways, by producing a small defocusing kick which depends on the beam bunch charge. By repeating optics measurements for different bunch charges, it is possible to disentangle the contribution produced by each impedance source from the dominating focusing effects given by the machine optics. But hunting for such faint defocusing effects poses strong requirements on the precision and sensibility of the measurements, and slow machine drifts or different thermal conditions shall be avoided. In this report, we present a novel method to assess in a fast and precise manner machine optics for different bunch charges using BPM turn-by-turn data and hybrid filling patterns. Finally, measurements for different ALBA machine components like scrapers and In-vacuum undulators are compared with simulation results.  
DOI • reference for this paper ※ DOI:10.18429/JACoW-IPAC2016-MOPOR007  
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