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RIS citation export for MOPOR007: Local Impedance Measurements at ALBA from Turn-by-Turn Acquisition

AU - Carlà, M.
AU - Benedetti, G.
AU - Günzel, T.F.G.
AU - Iriso, U.
AU - Martí, Z.
ED - Petit-Jean-Genaz, Christine
ED - Kim, Dong Eon
ED - Kim, Kyung Sook
ED - Ko, In Soo
ED - Schaa, Volker RW
TI - Local Impedance Measurements at ALBA from Turn-by-Turn Acquisition
J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016
C1 - Busan, Korea
T2 - International Particle Accelerator Conference
T3 - 7
LA - english
AB - A transverse impedance source manifests itself, among other ways, by producing a small defocusing kick which depends on the beam bunch charge. By repeating optics measurements for different bunch charges, it is possible to disentangle the contribution produced by each impedance source from the dominating focusing effects given by the machine optics. But hunting for such faint defocusing effects poses strong requirements on the precision and sensibility of the measurements, and slow machine drifts or different thermal conditions shall be avoided. In this report, we present a novel method to assess in a fast and precise manner machine optics for different bunch charges using BPM turn-by-turn data and hybrid filling patterns. Finally, measurements for different ALBA machine components like scrapers and In-vacuum undulators are compared with simulation results.
CP - Geneva, Switzerland
SP - 598
EP - 601
KW - impedance
KW - insertion
KW - lattice
KW - vacuum
KW - optics
DA - 2016/06
PY - 2016
SN - 978-3-95450-147-2
DO - 10.18429/JACoW-IPAC2016-MOPOR007
UR - http://jacow.org/ipac2016/papers/mopor007.pdf
ER -