ICALEPCS2011 - List of Authors (Xu, H.)

Paper

Title

Page

NSLS-II Beam Diagnostics Control System

168

Y. Hu, L.R. Dalesio, K. Ha, O. Singh, H. Xu
BNL, Upton, Long Island, New York, USA

A correct measurement of NSLS-II beam parameters (beam position, beam size, circulating current, beam emittance, etc.) depends on the effective combinations of beam monitors, control and data acquisition system and high level physics applications. This paper will present EPICS-based control system for NSLS-II diagnostics and give detailed descriptions of diagnostics controls interfaces including classifications of diagnostics, proposed electronics and EPICS IOC platforms, and interfaces to other subsystems. Device counts in diagnostics subsystems will also be briefly described.

Poster MOPKS004 [0.167 MB]

WEPKN018

NSLS-II Vacuum Control for Chamber Acceptance

742

H. Xu, L.R. Dalesio, M.J. Ferreira, H.-C. Hseuh, D. Zigrosser
BNL, Upton, Long Island, New York, USA

Funding: Work supported by U.S. Department of Energy
The National Synchrotron Light Source II (NSLS-II) uses extruded aluminium chambers as an integral part of the vacuum system. Prior to installation in the Storage Ring all dipole and multipole chamber assemblies must be tested to ensure vacuum integrity. A significant part of the chamber test requires a full bakeout of the assembly, as well as control and monitoring of the titanium sublimation pumps (TSP), non-evaporable getter pumps (NEG) and ion pumps (IP). Data that will be acquired by the system during bakeouts includes system temperature, vacuum pressure, residual gas analyzer scans, ion pump current, TSP operation and NEG activation. This data will be used as part of the acceptance process of the chambers prior to the installation in the storage ring tunnel. This paper presents the design and implementation of the vacuum bakeout control, as well as related vacuum control issues.

Poster WEPKN018 [1.174 MB]

Paper	Title	Page
MOPKS004	NSLS-II Beam Diagnostics Control System	168
	Y. Hu, L.R. Dalesio, K. Ha, O. Singh, H. Xu BNL, Upton, Long Island, New York, USA
	A correct measurement of NSLS-II beam parameters (beam position, beam size, circulating current, beam emittance, etc.) depends on the effective combinations of beam monitors, control and data acquisition system and high level physics applications. This paper will present EPICS-based control system for NSLS-II diagnostics and give detailed descriptions of diagnostics controls interfaces including classifications of diagnostics, proposed electronics and EPICS IOC platforms, and interfaces to other subsystems. Device counts in diagnostics subsystems will also be briefly described.
	Poster MOPKS004 [0.167 MB]

WEPKN018	NSLS-II Vacuum Control for Chamber Acceptance	742
	H. Xu, L.R. Dalesio, M.J. Ferreira, H.-C. Hseuh, D. Zigrosser BNL, Upton, Long Island, New York, USA
	Funding: Work supported by U.S. Department of Energy The National Synchrotron Light Source II (NSLS-II) uses extruded aluminium chambers as an integral part of the vacuum system. Prior to installation in the Storage Ring all dipole and multipole chamber assemblies must be tested to ensure vacuum integrity. A significant part of the chamber test requires a full bakeout of the assembly, as well as control and monitoring of the titanium sublimation pumps (TSP), non-evaporable getter pumps (NEG) and ion pumps (IP). Data that will be acquired by the system during bakeouts includes system temperature, vacuum pressure, residual gas analyzer scans, ion pump current, TSP operation and NEG activation. This data will be used as part of the acceptance process of the chambers prior to the installation in the storage ring tunnel. This paper presents the design and implementation of the vacuum bakeout control, as well as related vacuum control issues.
	Poster WEPKN018 [1.174 MB]