ICALEPCS2011 - List of Authors (Singh, O.)

Paper

Title

Page

NSLS-II Beam Diagnostics Control System

168

Y. Hu, L.R. Dalesio, K. Ha, O. Singh, H. Xu
BNL, Upton, Long Island, New York, USA

A correct measurement of NSLS-II beam parameters (beam position, beam size, circulating current, beam emittance, etc.) depends on the effective combinations of beam monitors, control and data acquisition system and high level physics applications. This paper will present EPICS-based control system for NSLS-II diagnostics and give detailed descriptions of diagnostics controls interfaces including classifications of diagnostics, proposed electronics and EPICS IOC platforms, and interfaces to other subsystems. Device counts in diagnostics subsystems will also be briefly described.

Poster MOPKS004 [0.167 MB]

MOPKS015

Diagnostics Control Requirements and Applications at NSLS-II

192

Y. Hu, L.R. Dalesio, K. Ha, O. Singh
BNL, Upton, Long Island, New York, USA

To measure various beam parameters such as beam position, beam size, circulating current, beam emittance, etc., a variety of diagnostic monitors will be deployed at NSLS-II. The Diagnostics Group and the Controls Group are working together on control requirements for the beam monitors. The requirements are originated from and determined by accelerator physics. An attempt of analyzing and translating physics needs into control requirements is made. The basic functionalities and applications of diagnostics controls are also presented.

Poster MOPKS015 [0.142 MB]

Paper	Title	Page
MOPKS004	NSLS-II Beam Diagnostics Control System	168
	Y. Hu, L.R. Dalesio, K. Ha, O. Singh, H. Xu BNL, Upton, Long Island, New York, USA
	A correct measurement of NSLS-II beam parameters (beam position, beam size, circulating current, beam emittance, etc.) depends on the effective combinations of beam monitors, control and data acquisition system and high level physics applications. This paper will present EPICS-based control system for NSLS-II diagnostics and give detailed descriptions of diagnostics controls interfaces including classifications of diagnostics, proposed electronics and EPICS IOC platforms, and interfaces to other subsystems. Device counts in diagnostics subsystems will also be briefly described.
	Poster MOPKS004 [0.167 MB]

MOPKS015	Diagnostics Control Requirements and Applications at NSLS-II	192
	Y. Hu, L.R. Dalesio, K. Ha, O. Singh BNL, Upton, Long Island, New York, USA
	To measure various beam parameters such as beam position, beam size, circulating current, beam emittance, etc., a variety of diagnostic monitors will be deployed at NSLS-II. The Diagnostics Group and the Controls Group are working together on control requirements for the beam monitors. The requirements are originated from and determined by accelerator physics. An attempt of analyzing and translating physics needs into control requirements is made. The basic functionalities and applications of diagnostics controls are also presented.
	Poster MOPKS015 [0.142 MB]