BNL, Upton, Long Island, New York, USA
| Paper | Title | Page |
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| WEPKN014 | NSLS-II Filling Pattern Measurement | 735 |
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| Multi-bunch injection will be deployed at NSLS-II. High bandwidth diagnostic monitors with high-speed digitizers are used to measure bunch-by-bunch charge variation. The requirements of filling pattern measurement and layout of beam monitors are described. The evaluation results of commercial fast digitizer Agilent Acqiris and high bandwidth detector Bergoz FCT are presented. | ||
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Poster WEPKN014 [0.313 MB] | |