Author: Pinayev, I.
Paper Title Page
WEPKN014 NSLS-II Filling Pattern Measurement 735
  • Y. Hu, L.R. Dalesio, K. Ha, I. Pinayev
    BNL, Upton, Long Island, New York, USA
  Multi-bunch injection will be deployed at NSLS-II. High bandwidth diagnostic monitors with high-speed digitizers are used to measure bunch-by-bunch charge variation. The requirements of filling pattern measurement and layout of beam monitors are described. The evaluation results of commercial fast digitizer Agilent Acqiris and high bandwidth detector Bergoz FCT are presented.  
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