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WEPB04 |
Comparison of YAG Screens and LYSO Screens at PITZ |
electron, HOM, emittance, laser |
438 |
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- R. Niemczyk, P. Boonpornprasert, Y. Chen, J.D. Good, M. Groß, H. Huck, I.I. Isaev, D.K. Kalantaryan, C. Koschitzki, M. Krasilnikov, X. Li, O. Lishilin, G. Loisch, D. Melkumyan, A. Oppelt, H.J. Qian, Y. Renier, F. Stephan, Q.T. Zhao
DESY Zeuthen, Zeuthen, Germany
- W. Hillert
University of Hamburg, Institut für Experimentalphysik, Hamburg, Germany
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The Photo Injector Test facility at DESY in Zeuthen (PITZ) is dedicated to the development of high-brightness electron sources for free-electron lasers. At PITZ, to measure the emittance of space-charge-dominated beams, the slit scan technique is used. For slice emittance measurements a transverse deflecting structure (TDS) is employed. The electron beam distribution is measured by means of scintillator screens. Both the TDS and the slit mask reduce the signal strength, giving stringent requirements on the sensitivity of the screens. At PITZ, high-sensitivity Ce:LYSO screens have been installed at the same screen stations as the standard Ce:YAG screens to solve low-intensity issues. A comparison of both screens is presented.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB04
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About • |
paper received ※ 03 September 2018 paper accepted ※ 11 September 2018 issue date ※ 29 January 2019 |
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WEPB12 |
Design and Implementation of Non-Invasive Profile Monitors for the ESS LEBT |
instrumentation, HOM, ion-source, simulation |
455 |
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- C.A. Thomas, T.J. Grandsaert, H. Kocevar, Ø. Midttun, N. Milas, R. Miyamoto, T.J. Shea
ESS, Lund, Sweden
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Non-invasive Profile Monitors are designed and distributed along the ESS Linac. In the Low Energy Beam Transport (LEBT), a specific one has been designed to be primarily a beam position monitor. Its main requirement is to measure the beam position with 100µm accuracy, and in addition it provides the beam profile and size. This performance have been shown to be possible and remains to be demonstrated experimentally. The instrument is also potentially capable of measuring the angle of the beam and its divergence. In this paper we will study the accuracy of such a measurement as function of the instrument image quality.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB12
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About • |
paper received ※ 05 September 2018 paper accepted ※ 12 September 2018 issue date ※ 29 January 2019 |
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Export • |
reference for this paper using
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※ LaTeX,
※ Text/Word,
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