Paper |
Title |
Page |
WEPB09 |
Wire Scanner Measurements at the PAL-XFEL |
445 |
|
- G. Kim, H.-S. Kang, C. Kim, B.G. Oh, D.C. Shin
PAL, Pohang, Republic of Korea
|
|
|
The PAL-XFEL, an X-ray Free electron laser user facility based on a 10 GeV normal conducting linear accelerator, have been operational at Pohang, South Korea. The wire scanners are installed for transverse beam profile measurement of the Linac and the Hard X-ray undulator section. The wire scanner is a useful device for emittance measurements in the Hard X-ray undulator section. In this paper, we describe the details of the wire scanner and the results of the measurements.
|
|
DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB09
|
|
About • |
paper received ※ 05 September 2018 paper accepted ※ 12 September 2018 issue date ※ 29 January 2019 |
|
Export • |
reference for this paper using
※ BibTeX,
※ LaTeX,
※ Text/Word,
※ RIS,
※ EndNote (xml)
|
|
|