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TY - CONF AU - Kim, G. AU - Kang, H.-S. AU - Kim, C. AU - Oh, B.G. AU - Shin, D.C. ED - Schaa, Volker RW TI - Wire Scanner Measurements at the PAL-XFEL J2 - Proc. of IBIC2018, Shanghai, China, 09-13 September 2018 CY - Shanghai, China T2 - International Beam Instrumentation Conference T3 - 7 LA - english AB - The PAL-XFEL, an X-ray Free electron laser user facility based on a 10 GeV normal conducting linear accelerator, have been operational at Pohang, South Korea. The wire scanners are installed for transverse beam profile measurement of the Linac and the Hard X-ray undulator section. The wire scanner is a useful device for emittance measurements in the Hard X-ray undulator section. In this paper, we describe the details of the wire scanner and the results of the measurements. PB - JACoW Publishing CP - Geneva, Switzerland SP - 445 EP - 447 KW - undulator KW - FEL KW - electron KW - emittance KW - controls DA - 2019/01 PY - 2019 SN - 978-3-95450-201-1 DO - DOI: 10.18429/JACoW-IBIC2018-WEPB09 UR - http://jacow.org/ibic2018/papers/wepb09.pdf ER -