IBIC2018 - List of Authors (Bobb, L.)

Paper	Title	Page
WEPB14	Recent Results on Non-invasive Beam Size Measurement Methods Based on Polarization Currents	464
	S. Mazzoni, M. Bergamaschi, O.R. Jones, R. Kieffer, T. Lefèvre, F. Roncarolo CERN, Geneva, Switzerland A. Aryshev, N. Terunuma KEK, Ibaraki, Japan M.G. Billing, J.V. Conway, M.J. Forster, Y.L.P. Fuentes, J.P. Shanks, S. Wang, L.Y. Ying Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA V.V. Bleko, A.S. Konkov, A. Potylitsyn TPU, Tomsk, Russia L. Bobb DLS, Oxfordshire, United Kingdom P. Karataev, K. Lekomtsev JAI, Egham, Surrey, United Kingdom P. Karataev Royal Holloway, University of London, Surrey, United Kingdom
	We present recent results on non-invasive beam profile measurement techniques based on Diffraction Radiation (DR) and Cherenkov Diffraction Radiation (ChDR). Both methods exploit the analysis of broadband electromagnetic radiation resulting from polarization currents produced in, or at the boundary of, a medium in close proximity of a charged particle beam. To increase the resolution of DR, measurements were performed in the UV range at a wavelength of 250 nm. With such configurations, sensitivity to the beam size of a 1.2 GeV electron beam below 10 um was observed at the Accelerator Test Facility (ATF) at KEK, Japan. In the case of the ChDR, a proof of principle study was carried out at the Cornell Electron Storage Ring (CESR) where beam profiles were measured in 2017 on a 5.3 GeV positron beam. At the time of writing an experiment to measure the resolution limit of ChDR has been launched at ATF where smaller beam sizes are available. We will present experimental results and discuss the application of such techniques for future accelerators.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB14
About •	paper received ※ 05 September 2018 paper accepted ※ 11 September 2018 issue date ※ 29 January 2019
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WEPB18	Performance of a Reflective Microscope Objective in an X-ray Pinhole Camera	477
	L. Bobb, G. Rehm DLS, Oxfordshire, United Kingdom
	X-ray pinhole cameras are used to measure the transverse beam profile of the electron beam in the storage ring from which the emittance is calculated. As improvements to the accelerator lattice reduce the beam emittance, e.g. with upgrades to fourth generation synchrotron light sources, likewise the beam size will be reduced such that micron and sub-micron scale resolution is required for beam size measurement. Therefore the spatial resolution of the pinhole camera imaging system must be improved accordingly. Here, the performance of a reflective microscope objective is compared to the high quality refractive lens which is currently in use to image the scintillator screen to the camera. The modulation transfer functions for each system have been assessed and will be discussed.
	Poster WEPB18 [0.751 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB18
About •	paper received ※ 04 September 2018 paper accepted ※ 12 September 2018 issue date ※ 29 January 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Recent Results on Non-invasive Beam Size Measurement Methods Based on Polarization Currents

464

S. Mazzoni, M. Bergamaschi, O.R. Jones, R. Kieffer, T. Lefèvre, F. Roncarolo
CERN, Geneva, Switzerland
A. Aryshev, N. Terunuma
KEK, Ibaraki, Japan
M.G. Billing, J.V. Conway, M.J. Forster, Y.L.P. Fuentes, J.P. Shanks, S. Wang, L.Y. Ying
Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
V.V. Bleko, A.S. Konkov, A. Potylitsyn
TPU, Tomsk, Russia
L. Bobb
DLS, Oxfordshire, United Kingdom
P. Karataev, K. Lekomtsev
JAI, Egham, Surrey, United Kingdom
P. Karataev
Royal Holloway, University of London, Surrey, United Kingdom

We present recent results on non-invasive beam profile measurement techniques based on Diffraction Radiation (DR) and Cherenkov Diffraction Radiation (ChDR). Both methods exploit the analysis of broadband electromagnetic radiation resulting from polarization currents produced in, or at the boundary of, a medium in close proximity of a charged particle beam. To increase the resolution of DR, measurements were performed in the UV range at a wavelength of 250 nm. With such configurations, sensitivity to the beam size of a 1.2 GeV electron beam below 10 um was observed at the Accelerator Test Facility (ATF) at KEK, Japan. In the case of the ChDR, a proof of principle study was carried out at the Cornell Electron Storage Ring (CESR) where beam profiles were measured in 2017 on a 5.3 GeV positron beam. At the time of writing an experiment to measure the resolution limit of ChDR has been launched at ATF where smaller beam sizes are available. We will present experimental results and discuss the application of such techniques for future accelerators.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB14

About •

paper received ※ 05 September 2018 paper accepted ※ 11 September 2018 issue date ※ 29 January 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEPB18

Performance of a Reflective Microscope Objective in an X-ray Pinhole Camera

477

L. Bobb, G. Rehm
DLS, Oxfordshire, United Kingdom

X-ray pinhole cameras are used to measure the transverse beam profile of the electron beam in the storage ring from which the emittance is calculated. As improvements to the accelerator lattice reduce the beam emittance, e.g. with upgrades to fourth generation synchrotron light sources, likewise the beam size will be reduced such that micron and sub-micron scale resolution is required for beam size measurement. Therefore the spatial resolution of the pinhole camera imaging system must be improved accordingly. Here, the performance of a reflective microscope objective is compared to the high quality refractive lens which is currently in use to image the scintillator screen to the camera. The modulation transfer functions for each system have been assessed and will be discussed.

Poster WEPB18 [0.751 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB18

About •

paper received ※ 04 September 2018 paper accepted ※ 12 September 2018 issue date ※ 29 January 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)