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TY - CONF AU - Bobb, L. AU - Rehm, G. ED - Schaa, Volker RW TI - Performance of a Reflective Microscope Objective in an X-ray Pinhole Camera J2 - Proc. of IBIC2018, Shanghai, China, 09-13 September 2018 CY - Shanghai, China T2 - International Beam Instrumentation Conference T3 - 7 LA - english AB - X-ray pinhole cameras are used to measure the transverse beam profile of the electron beam in the storage ring from which the emittance is calculated. As improvements to the accelerator lattice reduce the beam emittance, e.g. with upgrades to fourth generation synchrotron light sources, likewise the beam size will be reduced such that micron and sub-micron scale resolution is required for beam size measurement. Therefore the spatial resolution of the pinhole camera imaging system must be improved accordingly. Here, the performance of a reflective microscope objective is compared to the high quality refractive lens which is currently in use to image the scintillator screen to the camera. The modulation transfer functions for each system have been assessed and will be discussed. PB - JACoW Publishing CP - Geneva, Switzerland SP - 477 EP - 481 KW - target KW - photon KW - electron KW - emittance KW - storage-ring DA - 2019/01 PY - 2019 SN - 978-3-95450-201-1 DO - DOI: 10.18429/JACoW-IBIC2018-WEPB18 UR - http://jacow.org/ibic2018/papers/wepb18.pdf ER -