FEL2019 - List of Authors (Lockmann, N.M.)

Paper	Title	Page
WEP012	THz Spectroscopy with MHz Repetition Rates for Bunch Profile Reconstructions at European XFEL	350
	N.M. Lockmann, C. Gerth, B. Schmidt, S. Wesch DESY, Hamburg, Germany
	The European X-ray Free-Electron Laser generates most powerful and brilliant X-ray laser pulses. Exact knowledge about the longitudinal electron bunch profile is crucial for the operation of the linear accelerator as well as for photon science experiments. The only longitudinal diagnostic downstream of the main linac is based on spectroscopy of diffraction radiation (DR). The spectral intensity of the DR in the THz and infrared regime is monitored by a four-staged grating spectrometer and allows non-invasive bunch length characterization based on form factor measurements in the range 0.7 - 60 THz. As the readout and signal shaping electronics of the spectrometer allow MHz readout rates, the longitudinal bunch profile of all bunches inside the bunch train can be characterized non-invasively and simultaneously to FEL operation. In this paper, form factor measurements along the bunch train will be described and presented as well as the resulting reconstructed current profiles.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-WEP012
About •	paper received ※ 20 August 2019 paper accepted ※ 29 August 2019 issue date ※ 05 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEP035	NIR Spectrometer for Bunch-Resolved, Non-Destructive Studies of Microbunching at European XFEL	392
	S. Fahlström, M. Hamberg Uppsala University, Uppsala, Sweden C. Gerth, N.M. Lockmann, B. Steffen DESY, Hamburg, Germany
	At the European X-ray Free Electron Laser high brilliance femtosecond FEL radiation pulses are generated for user experiments. For this to be achieved electron bunches must be reliably produced within very tight tolerances. In order to investigate the presence of micro-bunching, i.e. charge density variation along the electron bunch with features in the micron range, a prism-based NIR spectrometer with an InGaAs sensor, sensitive in the wavelength range 900 nm to 1700 nm was installed. The spectrometer utilizes diffraction radiation (DR) generated at electron beam energies of up to 17.5 GeV. The MHz repetition rate needed for bunch resolved measurements is made possible by the KALYPSO line detector system, providing a read-out rate of up to 2.7 MHz. We present the first findings from commissioning of the NIR spectrometer, and measurements on the impact of the laser heater system for various bunch compression settings, in terms of amplitude and bunch-to-bunch variance of the NIR spectra as well as FEL pulse energy.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-WEP035
About •	paper received ※ 20 August 2019 paper accepted ※ 29 August 2019 issue date ※ 05 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

THz Spectroscopy with MHz Repetition Rates for Bunch Profile Reconstructions at European XFEL

350

N.M. Lockmann, C. Gerth, B. Schmidt, S. Wesch
DESY, Hamburg, Germany

The European X-ray Free-Electron Laser generates most powerful and brilliant X-ray laser pulses. Exact knowledge about the longitudinal electron bunch profile is crucial for the operation of the linear accelerator as well as for photon science experiments. The only longitudinal diagnostic downstream of the main linac is based on spectroscopy of diffraction radiation (DR). The spectral intensity of the DR in the THz and infrared regime is monitored by a four-staged grating spectrometer and allows non-invasive bunch length characterization based on form factor measurements in the range 0.7 - 60 THz. As the readout and signal shaping electronics of the spectrometer allow MHz readout rates, the longitudinal bunch profile of all bunches inside the bunch train can be characterized non-invasively and simultaneously to FEL operation. In this paper, form factor measurements along the bunch train will be described and presented as well as the resulting reconstructed current profiles.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-WEP012

About •

paper received ※ 20 August 2019 paper accepted ※ 29 August 2019 issue date ※ 05 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

WEP035

NIR Spectrometer for Bunch-Resolved, Non-Destructive Studies of Microbunching at European XFEL

392

S. Fahlström, M. Hamberg
Uppsala University, Uppsala, Sweden
C. Gerth, N.M. Lockmann, B. Steffen
DESY, Hamburg, Germany

At the European X-ray Free Electron Laser high brilliance femtosecond FEL radiation pulses are generated for user experiments. For this to be achieved electron bunches must be reliably produced within very tight tolerances. In order to investigate the presence of micro-bunching, i.e. charge density variation along the electron bunch with features in the micron range, a prism-based NIR spectrometer with an InGaAs sensor, sensitive in the wavelength range 900 nm to 1700 nm was installed. The spectrometer utilizes diffraction radiation (DR) generated at electron beam energies of up to 17.5 GeV. The MHz repetition rate needed for bunch resolved measurements is made possible by the KALYPSO line detector system, providing a read-out rate of up to 2.7 MHz. We present the first findings from commissioning of the NIR spectrometer, and measurements on the impact of the laser heater system for various bunch compression settings, in terms of amplitude and bunch-to-bunch variance of the NIR spectra as well as FEL pulse energy.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-FEL2019-WEP035

About •

paper received ※ 20 August 2019 paper accepted ※ 29 August 2019 issue date ※ 05 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)