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TY - CONF AU - Fahlström, S. AU - Gerth, C. AU - Hamberg, M. AU - Lockmann, N.M. AU - Steffen, B. ED - Schaa, Volker R.W. ED - Decking, Winfried ED - Sinn, Harald ED - Geloni, Gianluca ED - Schreiber, Siegfried ED - Marx, Michaela TI - NIR Spectrometer for Bunch-Resolved, Non-Destructive Studies of Microbunching at European XFEL J2 - Proc. of FEL2019, Hamburg, Germany, 26-30 August 2019 CY - Hamburg, Germany T2 - Free Electron Laser Conference T3 - 39 LA - english AB - At the European X-ray Free Electron Laser high brilliance femtosecond FEL radiation pulses are generated for user experiments. For this to be achieved electron bunches must be reliably produced within very tight tolerances. In order to investigate the presence of micro-bunching, i.e. charge density variation along the electron bunch with features in the micron range, a prism-based NIR spectrometer with an InGaAs sensor, sensitive in the wavelength range 900 nm to 1700 nm was installed. The spectrometer utilizes diffraction radiation (DR) generated at electron beam energies of up to 17.5 GeV. The MHz repetition rate needed for bunch resolved measurements is made possible by the KALYPSO line detector system, providing a read-out rate of up to 2.7 MHz. We present the first findings from commissioning of the NIR spectrometer, and measurements on the impact of the laser heater system for various bunch compression settings, in terms of amplitude and bunch-to-bunch variance of the NIR spectra as well as FEL pulse energy. PB - JACoW Publishing CP - Geneva, Switzerland SP - 392 EP - 395 KW - FEL KW - electron KW - laser KW - bunching KW - free-electron-laser DA - 2019/11 PY - 2019 SN - "" SN - 978-3-95450-210-3 DO - doi:10.18429/JACoW-FEL2019-WEP035 UR - http://jacow.org/fel2019/papers/wep035.pdf ER -