| Title |
Thermal Stress Analysis of a Thin Diamond Crystal Under Repeated Free Electron Laser Heat Load |
| Authors |
- J. Wu
SLAC, Menlo Park, California, USA
- B. Yang
University of Texas at Arlington, Arlington, USA
|
| Abstract |
Thin crystals are used in many important optical elements, such as monochromator and spectrometer, in XFELs. To function properly, they must survive the ever-increasing heat load under repeated pulses. Here, we conduct a thermal stress analysis to examine the crystal lattice distortion due to the thermal load under various rep rates from 0.1 to 1 MHz. The thermal field is obtained by solving the transient heat transfer equations. The temperature-dependent material properties are used. It is shown that for pulse adsorption energy around tens of microjoule over a spot size of 10 micrometer, the thermal response of diamond is sensitive to rep rate. The thermal strain components are very different in the in- and out-of-plane directions, due to different constraint conditions. It suggests complicated strain effects in the Bragg and Laue diffraction cases.
|
| Funding |
The work was supported by the US Department of Energy (DOE) under contract DE-AC02-76SF00515 and the US DOE Office of Science Early Career Research Program grant FWP-2013-SLAC-100164. |
| Paper |
download WEP061.PDF [1.157 MB / 4 pages] |
| Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
※ RIS
※ EndNote |
| Conference |
FEL2017, Santa Fe, NM, USA |
| Series |
International Free Electron Laser Conference (38th) |
| Proceedings |
Link to full FEL2017 Proccedings |
| Session |
Poster III |
| Date |
23-Aug-17 15:30–17:30 |
| Main Classification |
Undulators, Photon Diagnostics, Beamline |
| Keywords |
ion, FEL, laser, electron, free-electron-laser |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Kip Bishofberger (LANL, Los Alamos, NM, USA); Bruce Carlsten (LANL, Los Alamos, NM, USA); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-179-3 |
| Published |
February 2018 |
| Copyright |
|
