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TY - CONF AU - Wu, J. AU - Yang, B. ED - Bishofberger, Kip:Carlsten, Bruce (LANL, Los Alamos, NM, USA)[ORCID:0000-0001-5619-907X] ED - Schaa, Volker RW TI - Thermal Stress Analysis of a Thin Diamond Crystal Under Repeated Free Electron Laser Heat Load J2 - Proc. of FEL2017, Santa Fe, NM, USA, August 20-25, 2017 C1 - Santa Fe, NM, USA T2 - International Free Electron Laser Conference T3 - 38 LA - english AB - Thin crystals are used in many important optical elements, such as monochromator and spectrometer, in XFELs. To function properly, they must survive the ever-increasing heat load under repeated pulses. Here, we conduct a thermal stress analysis to examine the crystal lattice distortion due to the thermal load under various rep rates from 0.1 to 1 MHz. The thermal field is obtained by solving the transient heat transfer equations. The temperature-dependent material properties are used. It is shown that for pulse adsorption energy around tens of microjoule over a spot size of 10 micrometer, the thermal response of diamond is sensitive to rep rate. The thermal strain components are very different in the in- and out-of-plane directions, due to different constraint conditions. It suggests complicated strain effects in the Bragg and Laue diffraction cases. PB - JACoW CP - Geneva, Switzerland SP - 539 EP - 542 KW - ion KW - FEL KW - laser KW - electron KW - free-electron-laser DA - 2018/02 PY - 2018 SN - 978-3-95450-179-3 DO - 10.18429/JACoW-FEL2017-WEP061 UR - http://jacow.org/fel2017/papers/wep061.pdf ER -