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Huang, J. Y.

Paper Title Page
MOPPH040 A Study of Detection Schemes in Electro-Optic Sampling Technique 101
 
  • J. Y. Huang, C. Kim, I. S. Ko, Y. W. Parc
    PAL, Pohang, Kyungbuk
 
  Electro-Optic Sampling (EOS) is the ingenious tool for the measurement of the electron beam or Thz radiation. There are two traditional detection schemes: one is the crossed polarizer scheme and another is balanced detection one. A new detection scheme called Near Crossed Polarizer scheme in the EOS technique is developed to increase the Signal to Noise Ratio in the experiment. The new detection scheme is studied in detail and the 3D scanning result with electron beam in FLASH is compared with the detection scheme. The new detection scheme has an analytical problem which shows two solutions for the relative phase shift for specific measurement of the electron beam. That problem is also studied through the comparative study between simulation and the analyzed data from the TEO setup in FLASH.  
MOPPH041 Comparative Study of Electro-Optic Effect between Simulation and Measurement 104
 
  • J. Y. Huang, C. Kim, I. S. Ko, Y. W. Parc
    PAL, Pohang, Kyungbuk
 
  The short, intense, and low emittance electron beams are crucial to make high quality X-ray beam for X-ray free electron laser (XFEL). Electro-Optic Sampling (EOS) is a promising method to measure the electron bunch length non-destructively. A simulation study is done with the pulse propagation method, which utilizes Fourier transform to investigate the evolution of electromagnetic pulse inside the electro-optic (EO) crystal. The experimental result measured with spatial decoding method at Free electron LASer in Hamburg (FLASH) facility in Deutsches Elektronen-Synchrotron (DESY) is analyzed in terms of the relative phase shift between the horizontal and vertical component of the laser pulse. In this report, the experimental results expressed in terms of the "Relative Phase Shift Г" are compared with the simulation result. The simulation and the experimental result show similar values within reasonable error. The way to increase the signal level is also proposed.  
MOPPH061 Design of the PAL Test FEL Machine 149
 
  • J. Choi, J. Y. Huang, H.-S. Kang, I. S. Ko, T.-Y. Lee, J.-S. Oh, S. J. Park, M. Kim
    PAL, Pohang, Kyungbuk
  • C. M. Yim
    POSTECH, Pohang, Kyungbuk
 
  In a road to the PAL-XFEL, the 1st stage will be to build a test machine, whose design parameters are presented here. It will be a 230 MeV machine that has the target wavelength of visible range. The design details and simulation results are shown in this paper.