Keyword: photon
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MOYZO02 High Resolution X-ray Imaging as a Powerful Diagnostics Tool to Investigate ECRIS Plasma Structure and Confinement Dynamics plasma, ECR, electron, ion-source 32
 
  • E. Naselli, G. Castro, L. Celona, S. Gammino, D. Mascali, M. Mazzaglia, G. Torrisi
    INFN/LNS, Catania, Italy
  • S. Biri, Z. Perduk, R. Rácz
    Atomki, Debrecen, Hungary
  • A. Galatà
    INFN/LNL, Legnaro (PD), Italy
  • E. Naselli
    Catania University, Catania, Italy
  • J. Pálinkás
    DU, Debrecen, Hungary
 
  High resolution spatially-resolved X-ray spectroscopy, by means of a X-ray pin-hole camera setup* ** operating in the 0.5-20 keV energy domain, is a very powerful method for ECRIS plasma structure evaluation. We present the setup installed at a 14 GHz ECRIS (ATOMKI, Debrecen), including a multi-layered collimator enabling measurements up to several hundreds of watts of RF pumping power and the achieved spatial and energy resolution (0.5 mm and 300 eV). Results coming by a new algorithm for analyzing Integrated (multi-events detection) and Photon-Counted images (single-event detection) to perform energy-resolved investigation will be described. The analysis permits to investigate High-Dynamic-Range (HDR) and spectrally resolved images, to study the effect of the axial and radial confinement (even separately), the plasma radius, the fluxes of deconfined electrons distinguishing fluorescence lines of the materials of the plasma chamber (Ti, Ta) from plasma (Ar) fluorescence lines. This method allows a detailed characterization of warm electrons, important for ionization, and to quantitatively estimate local plasma density and spectral temperature pixel-by-pixel.
*S. Biri et al., JINST 13(11):C11016-C11016, DOI:10.1088/1748-0221/13/11/C11016
**E. Naselli et al., JINST 14(10):C10008-C10008, DOI:10.1088/1748-0221/14/10/C10008
 
slides icon Slides MOYZO02 [26.629 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2020-MOYZO02  
About • Received ※ 27 September 2020 — Revised ※ 02 October 2020 — Accepted ※ 18 November 2020 — Issue date ※ 17 December 2020
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