Osaka University, Graduate School of Engineering, Osaka, Japan
*Y. Kato, et al., RSI, 2014, 85, 02A950-1-3.
**Y. Kato, et al., RSI, 2016, 87, 02A710-1-4.
| Paper | Title | Page |
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| WEWZO05 | Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components | 125 |
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Electron cyclotron resonance ion source (ECRIS) has been constructed for producing synthesized ion beams in Osaka Univ.*,** Xe is used as fuel for ion propulsion engines on artificial satellites. There are problems of accumulated damages at irradiation and sputtering by low energy Xe ion from the engine. It is required to construct experimentally sputtering yield databases of ion beams in the low energy region from several hundred eV to 1keV, since there are not enough data of satellite component materials. Therefore, we are trying to investigate experimentally sputtering yield on materials by irradiating the low energy single species Xeq+ ion beams. However, there is a problem that if the low extraction voltage, the amount of beam currents is not enough to obtain ion beam flux for precise evaluation of sputtering yield data. Thus, we conduct to decelerate Xeq+ ion beams required low energy region after extracting at high voltage, e.g., 10kV. We measured the decelerated beam profile with x and y direction wire probes. As a result, we were able to estimate the dose of ion fluxes. We are going to conduct irradiation experiments on various materials.
*Y. Kato, et al., RSI, 2014, 85, 02A950-1-3. **Y. Kato, et al., RSI, 2016, 87, 02A710-1-4. |
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Slides WEWZO05 [8.964 MB] | |
| DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2020-WEWZO05 | |
| About • | Received ※ 27 September 2020 — Revised ※ 25 September 2020 — Accepted ※ 29 September 2020 — Issue date ※ 14 July 2022 | |
| Cite • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | |