JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
TY - CONF AU - Sato, K. AU - Harisaki, S. AU - Kato, Y. AU - Kubo, W. AU - Okumura, K. AU - Owada, I. AU - Tsuda, K. ED - Machicoane, Guillaume ED - Allen, Alexa ED - Lesage, Ana ED - Schaa, Volker R.W. TI - Beam Profile Measurements of Decelerated Multicharged Xe Ions from ECRIS for Estimating Low Energy Damage on Satellites Components J2 - Proc. of ECRIS2020, East Lansing, MI, USA, 28-30 September 2020 CY - East Lansing, MI, USA T2 - International Workshop on ECR Ion Sources T3 - 24 LA - english AB - Electron cyclotron resonance ion source (ECRIS) has been constructed for producing synthesized ion beams in Osaka Univ.*,** Xe is used as fuel for ion propulsion engines on artificial satellites. There are problems of accumulated damages at irradiation and sputtering by low energy Xe ion from the engine. It is required to construct experimentally sputtering yield databases of ion beams in the low energy region from several hundred eV to 1keV, since there are not enough data of satellite component materials. Therefore, we are trying to investigate experimentally sputtering yield on materials by irradiating the low energy single species Xeq+ ion beams. However, there is a problem that if the low extraction voltage, the amount of beam currents is not enough to obtain ion beam flux for precise evaluation of sputtering yield data. Thus, we conduct to decelerate Xeq+ ion beams required low energy region after extracting at high voltage, e.g., 10kV. We measured the decelerated beam profile with x and y direction wire probes. As a result, we were able to estimate the dose of ion fluxes. We are going to conduct irradiation experiments on various materials. PB - JACoW Publishing CP - Geneva, Switzerland SP - 125 EP - 127 KW - radiation KW - experiment KW - ECR KW - ECRIS KW - electron DA - 2022/07 PY - 2022 SN - 2222-5692 SN - 978-3-95450-226-4 DO - doi:10.18429/JACoW-ECRIS2020-WEWZO05 UR - https://jacow.org/ecris2020/papers/wewzo05.pdf ER -