Paper | Title | Page |
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WEA4 | Time Resolved X-Ray Measurements in a Simple Mirror Trap | 162 |
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The time-resolved characterization of the X-ray emission represents an innovative technique to investigate the heating mechanism of the worm/hot electron component in ECRIS devices. In this paper, the technique has been described and the results of an experimental campaign of measurements in order to characterize the X-rays emission of an axis-symmetric simple mirror trap has been showed. Particular attention has been paid to the ignition and turning off phase. This approach has permitted to estimate confinement time of the warm/hot electron population and put in evidence eventual instability effects during the critical phases. Further developments and perspectives of the technique will be highlighted. | ||
DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-ECRIS2018-WEA4 | |
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