Author: Altana, C.
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WEA4 Time Resolved X-Ray Measurements in a Simple Mirror Trap 162
  • S.T. Salvatore, C. Altana, G. Castro, L. Celona, S. Gammino, G.L. Lanzalone, G.L. Litrico, D. Mascali, M. Mazzaglia, A.M. Muoio, E. Naselli, G. Torrisi
    INFN/LNS, Catania, Italy
  • R. Miracoli
    ESS Bilbao, Zamudio, Spain
  • E. Naselli
    Catania University, Catania, Italy
  The time-resolved characterization of the X-ray emission represents an innovative technique to investigate the heating mechanism of the worm/hot electron component in ECRIS devices. In this paper, the technique has been described and the results of an experimental campaign of measurements in order to characterize the X-rays emission of an axis-symmetric simple mirror trap has been showed. Particular attention has been paid to the ignition and turning off phase. This approach has permitted to estimate confinement time of the warm/hot electron population and put in evidence eventual instability effects during the critical phases. Further developments and perspectives of the technique will be highlighted.  
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