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- H. Schlarb, A. Azima, S. Düsterer, M. Huening, E.-A. Knabbe, M. Roehrs, R. Rybnikov, B. Schmidt, B. Steffen
DESY, Hamburg
- M.C. Ross
SLAC, Menlo Park, California
- P. Schmüser, A. Winter
Uni HH, Hamburg
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Diagnostic devices to precisely measure the longitudinal electron beam profile and the bunch arrival time require elaborate new instrumentation techniques. At the VUV-FEL, two entirely different methods are used. The bunch profile can be determined with high precision by a transverse deflecting RF structure. The method is disruptive and does not allow to monitor multiple bunches in a macro-pulse train. Therefore, it is augmented by two non-disruptive electro-optical devices, called EO and TEO. The EO setup uses a dedicated diagnostic laser synchronized to the machine RF. The longitudinal electron beam profile is encoded in the intensity profile of a chirped laser pulse and analyzed by looking at the spectral composition of the pulse. The second setup, TEO, utilizes the TiSa-based laser system used for pump-probe experiments. Here, the temporal electron shape is encoded into a spatial dimension of laser pulse by an intersection angle between the laser and the electron beam at the EO-crystal. In this paper, we present a comparative study of bunch length and arrival time measurements performed simultaneously with all three experimental techniques.
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