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Muto, T.

 
Paper Title Page
THOBFI02 Measurement of the Beam Profiles with the Improved Fresnel Zone Plate Monitor 2784
 
  • H. Sakai, N. Nakamura
    ISSP/SRL, Chiba
  • H. Hayano, T. Muto
    KEK, Ibaraki
  
  We present the recent progress of the FZP (Fresnel Zone Plate) beam profile monitor constructed at KEK-ATF damping ring. This monitor based on an X-ray imaging optics with two FZPs*. In this monitor, the transverse electron beam image at bending magnet is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. Then the real-time and 2-dimentional transverse beam profiles can be obtained with non-destructive manner by using this monitor. The expected spatial resolution is less than 1 micro-meter. Recently, we install the new mechanical shutter to improve time resolution of the monitor and avoid the effects of the short-term movement of the beam or the monitor itself. By applying this shutter, the shutter opening time was reduced less than 1ms and the beam profile could be measured more accurately. In this paper, we report the new shutter performance and the measurement results of beam profiles by the improved FZP beam profile monitor.

*K. Iida, et al. Nucl. Instrum. Meth. A 506 (2003) 41-49.

 
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