| Paper |
Title |
Page |
| TUP25 |
Application of Flux Gate Magnetometry to Electropolishing
|
351 |
| |
- C. Bonavolonta
Naples University Federico II, Napoli
- F. Laviano
Turin Politecnic, Turin
- V. Palmieri
INFN/LNL, Legnaro, Padova
- M. Valentino
INFM, Napoli, Napoli
|
|
| THP11 |
Morphology of Niobium Films Sputtered at Different Target-Substrate Angle
|
614 |
| |
- D. Tonini
Univ. degli Studi di Padova, Padova
- C. Greggio, V. Palmieri
INFN/LNL, Legnaro, Padova
- G. Keppel, G. Torzo
INFM, Padova, Padova
- F. Laviano
Turin Politecnic, Turin
- M. Musiani
CNR-IENI, Padua
|
|