Author: Raparia, D.
Paper Title Page
MOOBA2 The RHIC Polarized Source Upgrade 49
 
  • A. Zelenski, G. Atoian, J.M. Fite, D. Raparia, J. Ritter, D. Steski
    BNL, Upton, Long Island, New York, USA
  • V.I. Davydenko, A.A. Ivanov, A. Kolmogorov
    BINP SB RAS, Novosibirsk, Russia
  • V.S. Klenov, V. Zubets
    RAS/INR, Moscow, Russia
 
  A novel polarization technique had been successfully implemented in the RHIC polarized H ion source upgrade to higher intensity and polarization for use in the RHIC polarization physics program at enhanced luminosity RHIC operation. In this technique a primary proton beam inside the high magnetic field solenoid is produced by charge-exchange ionization of the atomic hydrogen beam in the He-gas ionizer cell. Further proton polarization is produced in the process of polarized electron capture from the optically-pumped Rb vapour. Formation of the proton beam is produced by four-electrode spherical multi-aperture ion-optical system with geometrical focusing. Polarized beam intensity produced in the source exceeds 4.0 mA.Maximum polarization of 84% was measured at 0.3 mA beam intensity and 80% at 0.5 mA in 200 MeV polarimeter. This high beam intensity allowed reduction of the longitudinal and transverse beam emittances at injection to AGS to reduce polarization losses in AGS. The source reliably delivered polarized beam for 2013 run in RHIC at √s=510 GeV. This was a major contribution to the RHIC polarization increase to over 60 % for colliding beams.  
slides icon Slides MOOBA2 [6.481 MB]  
 
TUPHO01 The RHIC E-Lens Test Bench Experimental Results 580
 
  • X. Gu, Z. Altinbas, J.N. Aronson, E.N. Beebe, W. Fischer, D.M. Gassner, K. Hamdi, J. Hock, L.T. Hoff, P. Kankiya, R.F. Lambiase, Y. Luo, M. Mapes, J.-L. Mi, T.A. Miller, C. Montag, S. Nemesure, M. Okamura, R.H. Olsen, A.I. Pikin, D. Raparia, P.J. Rosas, J. Sandberg, Y. Tan, C. Theisen, P. Thieberger, J.E. Tuozzolo, W. Zhang
    BNL, Upton, Long Island, New York, USA
 
  Funding: Work supported by U.S. DOE under contract No DE-AC02-98CH10886 with the U.S. Department of Energy.
To commission some of the hard and software for the RHIC electron lenses (e-lenses), a test bench was built based on the EBIS test stand at BNL. After several months of operation, the electron gun, collector, high-voltage gun modulator, instrumentation, partial control system, and several software applications have been tested. The nominal DC beam current of 0.85 A was demonstrated and the electron beam transverse profiles were verified to be Gaussian. Some e-lens power supplies and the electronics for current measurement were also evaluated on the test bench. The properties of the cathode and the profile of the beam are measured. In this paper, we will present some experimental results.