A   B   C   D   E   F   G   H   I   J   K   L   M   N   O   P   Q   R   S   T   U   V   W   X   Y   Z  

Yanagida, K.

Paper Title Page
TUP077 Development of Screen Monitor with a Spatial Resolution of Ten Micro-meters for XFEL/SPring-8 573
  • K. Yanagida, H. Tomizawa, A. Yamashita
    JASRI/SPring-8, Hyogo-ken
  • S.I. Inoue, Y. Otake
    RIKEN/SPring-8, Hyogo

At SPring-8, the 8 GeV linac for an X-ray free electron laser (XFEL) is now under construction. In order to realize the XFEL, highly qualified electron beams are required. A measurement of spatial structure of such beam is very important for the beam tuning of XFEL. The spatial structure is measured with a screen monitor, which we now develop. The resolution of the measurement is required within 10 um. The screen monitor comprises a vacuum chamber with a thin metal (100 um, SUS) foil to emit OTR, lenses for focusing and a CCD camera system. The main feature of the monitor is a bright and high-resolution optical system. In order to realize this system, the lenses are placed close to the foil, the distance between the lenses and the foil is 100 mm, and the lenses have a large diameter (2 in.). This optical-geometrical structure also contributes much to reduce the airy radius of a near field image. Although the range of an observation wavelength is wide as which is form 400 to 800 nm, the resolution of the measurement on the foil is calculated as 2.5 um. The experimental data of the developed screen monitor also suggested the same resolution.

TUP078 Development of Integrator Circuit for Charge Monitoring 576
  • K. Yanagida, H. Hanaki, S. Suzuki
    JASRI/SPring-8, Hyogo-ken

At the SPring-8 1 GeV linac, a beam current or charge is measured by means of an integrator circuit. A signal from a current transformer is processed into an integrated voltage. The Fast Gated Integrator and Boxcar Averager Module (Stanford Research Systems) is presently used as the integrator. However we plan to expand a dynamic range and an integration time of the integrator. Because the noise level of the present integrator becomes too large for the expansion, we developed a low-noise and high-resolution integrator. Both the present and developed integrators have the same functions such as signal gating, accumulation of analog signal and sample hold. The principal noise of the integrator was found to be a switching noise of the gate switch. To reduce the switching noise a GaAs transfer switch SW-283-PIN (M/A-COM) was adopted as the gate switch. The experimental data of the developed integrator showed 1/10 of the noise level of the present integrator.