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Allen, C.K.

Paper Title Page
TUP091 Extracting Information Content within Noisy, Sampled Profile Data from Charged Particle Beams: Part II 612
  • C.K. Allen, W. Blokland, S.M. Cousineau, J. Galambos
    ORNL, Oak Ridge, Tennessee

Funding: This work was supported by SNS through UT-Battelle, LLC, under contract DE-AC05-00OR22725 for the U.S. DOE.
Charged-particle beam diagnostic devices such as wire scanners, wire harps, and laser scanners all provide data sets describing the one-dimensional density distributions of the beam at a particular location; these data are commonly called profile data. We use these data for further computations, usually beam properties such as position and size, but to do so requires a certain level of accuracy in the data. Thus, we must make real world considerations as to its information content. Specifically, we consider noise in the data and the fact that it is sampled. The operation of a typical profile device is outlined in order to create a general model for the data sets. Using signal processing techniques we identify the minimal sampling requirements for maintaining information content. Using Bayesian analysis we identify the most probable Gaussian signal within the data (the mean and standard deviation of the Gaussian signal can then be used for computations). Time permitting we present techniques for direct computation of beam properties using noisy, sampled profile data.