Author: Cary, J.R.
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MOPMA031 Simulations of Diamond Detectors with Schottky Contacts 617
 
  • G.I. Bell, J.R. Cary, D.A. Dimitrov, D. Meiser, D.N. Smithe, C.D. Zhou
    Tech-X, Boulder, Colorado, USA
  • M. Gaowei, E.M. Muller
    SBU, Stony Brook, New York, USA
  • J. Smedley
    BNL, Upton, Long Island, New York, USA
 
  Funding: This work is supported by the US DOE Office of Science, department of Basic Energy Sciences, grant numbers DE-SC0006246 and DE-SC0007577.
We present simulations of semiconductor devices using the code VSim (formerly Vorpal). The 3D simulations involve the movement and scattering of electrons and holes in the semiconductor, voltages which may be applied to external contacts, and self-consistent electrostatic fields inside the device. Particles may experience a Schottky barrier when moving between the semiconductor and a metal contact. Example devices include MOSFETs as well as a diamond X-ray detector. Our code VSim includes scattering models for GaAs and diamond, and runs in parallel on thousands of processors. We compare our simulation results with experimental results from a prototype diamond X-ray detector.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-MOPMA031  
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MOPMA033 Modeling Electron Emission and Surface Effects from Diamond Cathodes 620
 
  • D.A. Dimitrov, J.R. Cary, D.N. Smithe, C.D. Zhou
    Tech-X, Boulder, Colorado, USA
  • I. Ben-Zvi, T. Rao, J. Smedley, E. Wang
    BNL, Upton, Long Island, New York, USA
 
  Funding: We are grateful to the U.S. DoE Office of Basic Energy Sciences for supporting this work under grants DE-SC0006246 and DE-SC0007577.
We developed modeling capabilities, within the Vorpal particle-in-cell code, for three-dimensional (3D) simulations of surface effects and electron emission from semiconductor photocathodes. They include calculation of emission probabilities using general, piece-wise continuous, space-time dependent surface potentials, effective mass and band bending field effects. We applied these models, in combination with previously implemented capabilities for modeling charge generation and transport in diamond, to investigate the emission dependence on applied electric field in the range from approximately 2 to 17 MV/m along the [100] direction. The simulation results were compared to experimental data when using different emission models, band bending effects, and surface-dependent electron affinity. Simulations using surface patches with different levels of hydrogenation lead to the closest agreement with the experimental data.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-MOPMA033  
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WEIC5
University Transfer to Industry  
 
  • J.R. Cary
    Tech-X, Boulder, Colorado, USA
 
  University Transfer to Industry  
slides icon Slides WEIC5 [1.593 MB]  
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