Author: Mochihashi, A.
Paper Title Page
TUOCA03 Production of Quasi-monochromatic GeV Photons by Compton Scattering using Undulator X-ray Radiation at SPring-8 941
 
  • H. Ohkuma, A. Mochihashi, M. Oishi, S. Suzuki, K. Tamura
    JASRI/SPring-8, Hyogo-ken, Japan
  • N. Muramatsu, H. Shimizu
    Tohoku University, Research Center for Electron Photon Science, Sendai, Japan
  • T. Nakano
    RCNP, Osaka, Japan
 
  Funding: This work is supported by JSPS KAKENHI (Grant-in-Aid for Scientific Research) Grant Number 24241035.
Backward Compton scattering (BCS) of X-ray photons emitted by undulator and reflected back by a single crystal from the electron beam can produce a quasi-monochromatic gamma-ray beam up to an energy very close to the electron beam energy. The SPring-8 beam diagnostics beamline (BL05SS) is used to inject a reflected undulator X-ray radiation against 8 GeV stored electron beam and to extract a quasi-monochromatic 8 GeV gamma-ray produced by BCS. BL05SS has conditions to do a pilot experiment to obtain the gamma-ray beam using BCS of X-ray photons from existing undulator. Experimental setup including a Bragg mirror system is now under construction. Preliminary reflectivity measurement of a silicon Bragg mirror using around 10keV photons has been done. Status of the experimental preparation and the future outlook is presented.
 
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DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2014-TUOCA03  
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TUPRI050 Numerical Calculation and Experiment of Ion Related Phenomenon in SPring-8 Storage Ring 1680
 
  • A. Mochihashi, M. Takao
    JASRI/SPring-8, Hyogo-ken, Japan
 
  In the SPring-8 storage ring, various kinds of bunch filling pattern are available. Under some bunch filling patterns, residual gas ions created by scattering process between high energy electrons and residual gas molecules can be trapped stably around the electron beam and disturb the original motion of the beam. We have considered the stability of the electron beam due to the ion related phenomenon under several bunch filling patterns by computer simulation. In the simulation, we have modeled the electron bunch as single particle and the residual gas ions as macroparticles. The number of the trapped ions, size of the ion cloud and change in betatron oscillation amplitude of the beam under several filling pattern conditions will be discussed. We have also performed experiments for stability of the beam under equally spaced bunch filling patterns which give severe condition for the ion related instability. The numerical calculations and the experimental results will be discussed in the presentation.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2014-TUPRI050  
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