Author: Lee, H.H.
Paper Title Page
WEPRI034 Analysis of BCP Characteristics for SRF Cavities 2549
 
  • Y. Jung, H.J. Kim
    IBS, Daejeon, Republic of Korea
  • H.H. Lee, H.C. Yang
    KRICT, Daejoen, Republic of Korea
 
  A chemical polishing process is well-known critical process for improving superconducting cavities such as a quality factor and an acceleration electric filed with additional temperature treatment. Especially, Buffered Chemical Polishing (BCP) has been widely used in SRF (Superconducting Radio Frequency) cavity processing. We performed BCP experiments with 1:1:1 and 1:1:2 of an etchant ratio (HF:HNO3:H3PO4). In fact, BCP experiments were carried out by using both undeformed (as-receoved) and deformed niobium samples. We will report baseline BCP results by analyzing surface states of niobium samples such as optical photographs, etch rates and AFM (Atomic Force Microscopy) depending on temperature and time.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2014-WEPRI034  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)