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RIS citation export for WEPRI034: Analysis of BCP Characteristics for SRF Cavities

TY - CONF
AU - Jung, Y.
AU - Kim, H.J.
AU - Lee, H.H.
AU - Yang, H.C.
ED - Petit-Jean-Genaz, Christine
ED - Arduini, Gianluigi
ED - Michel, Peter
ED - Schaa, Volker RW
TI - Analysis of BCP Characteristics for SRF Cavities
J2 - Proc. of IPAC2014, Dresden, Germany, June 15-20, 2014
C1 - Dresden, Germany
T2 - International Particle Accelerator Conference
T3 - 5
LA - english
AB - A chemical polishing process is well-known critical process for improving superconducting cavities such as a quality factor and an acceleration electric filed with additional temperature treatment. Especially, Buffered Chemical Polishing (BCP) has been widely used in SRF (Superconducting Radio Frequency) cavity processing. We performed BCP experiments with 1:1:1 and 1:1:2 of an etchant ratio (HF:HNO3:H3PO4). In fact, BCP experiments were carried out by using both undeformed (as-receoved) and deformed niobium samples. We will report baseline BCP results by analyzing surface states of niobium samples such as optical photographs, etch rates and AFM (Atomic Force Microscopy) depending on temperature and time.
PB - JACoW
CP - Geneva, Switzerland
SP - 2549
EP - 2551
KW - niobium
KW - experiment
KW - SRF
KW - ion
KW - cavity
DA - 2014/07
PY - 2014
SN - 978-3-95450-132-8
DO - 10.18429/JACoW-IPAC2014-WEPRI034
UR - http://jacow.org/ipac2014/papers/wepri034.pdf
ER -