Author: Gogolev, A.S.
Paper Title Page
MOPME011 Investigation of the Applicability of Parametric X-ray Radiation for Transverse Beam Profile Diagnostics 491
  • G. Kube, C. Behrens
    DESY, Hamburg, Germany
  • A.S. Gogolev, Yu.A. Popov, A. Potylitsyn
    TPU, Tomsk, Russia
  • W. Lauth
    IKP, Mainz, Germany
  • S. Weisse
    DESY Zeuthen, Zeuthen, Germany
  Transverse beam profile diagnostics in electron linacs is widely based on optical transition radiation (OTR) as standard technique which is observed in backward direction when a charged particle beam crosses the boundary between two media with different dielectric properties. The experience from modern linac based light sources like LCLS or FLASH shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. A possibility to overcome this limitation is to measure at much shorter wavelengths, i.e. in the X-ray region, using parametric X-ray radiation (PXR) which additionally offers the advantage to be generated at crystal planes oriented under a certain angle to the crystal surface, thus allowing a spatial separation from a possible COTR background *. A first test experiment has been performed at the Mainz Microtron MAMI (University of Mainz, Germany) in order to study the applicability of PXR for beam diagnostics, and the status of this experiment will be presented.
* A. Gogolev, A. Potylitsyn, G. Kube, Journal of Physics 357 (2012) 012018