Author: Moore, T.P.
Paper Title Page
MOPPC019 Secondary Electron Yield Measurements of Fermilab’s Main Injector Vacuum Vessel 166
  • D.J. Scott, D. Capista, K.L. Duel, R.M. Zwaska
    Fermilab, Batavia, USA
  • S. Greenwald, W. Hartung, Y. Li, T.P. Moore, M.A. Palmer
    CLASSE, Ithaca, New York, USA
  • R.E. Kirby, M.T.F. Pivi, L. Wang
    SLAC, Menlo Park, California, USA
  We discuss the progress made on a new installation in Fermilab’s Main Injector that will help investigate the electron cloud phenomenon by making direct measurements of the secondary electron yield (SEY) of samples irradiated in the accelerator. In the Project X upgrade the Main Injector will have its beam intensity increased by a factor of three compared to current operations. This may result in the beam being subject to instabilities from the electron cloud. Measured SEY values can be used to further constrain simulations and aid our extrapolation to Project X intensities. The SEY test-stand, developed in conjunction with Cornell and SLAC, is capable of measuring the SEY from samples using an incident electron beam when the samples are biased at different voltages. We present the design and manufacture of the test-stand and the results of initial laboratory tests on samples prior to installation.  
WEOAB02 Photocathode R&D at Cornell University 2137
  • L. Cultrera, I.V. Bazarov, J.V. Conway, B.M. Dunham, Y. Hwang, Y. Li, X. Liu, R. Merluzzi, T.P. Moore, K.W. Smolenski
    CLASSE, Ithaca, New York, USA
  • S.S. Karkare, J.M. Maxson, W.J. Schaff
    Cornell University, Ithaca, New York, USA
  Funding: This work has been supported by NSF DMR-0807731 and by DOE DE-SC0003965.
A wide R&D program is pursued at Cornell University aimed at preparation and characterization of high efficiency photocathodes for the Energy Recovery Linac photoinjector. The currently investigated photoemitters include both positive and negative electron affinity materials such as respectively bi-alkali antimonide and III-V semiconductors activated with Cs and either O or F. Analysis techniques as Scanning Auger Spectroscopy, Low Energy Electron Diffraction, Reflected High Energy Electron Diffraction and work function measurements are used to characterize the surfaces properties of the specimens. Spectral response, photoemission uniformity, electron energy distributions are used to characterize the quality of the photoelectron beam and to relate it to the measured surface properties.
slides icon Slides WEOAB02 [6.934 MB]