Paper | Title | Page |
---|---|---|
MOCZB2 | Reference Distribution and Synchronization System for SwissFEL: Concept and First Results | 29 |
|
||
The development of the reference distribution and synchronization system for SwissFEL is driven by ultra-high reference signal stability of SwissFEL LLRF-, beam arrival time monitors (BAM) and laser systems on one hand and cost issues, high reliability/availability and flexibility on the other. Key requirements are down to sub-10fs rms short term as well as sub-10fs peak-peak long term temporal stability for the most critical clients. The system essentially consists of an optical master oscillator with a fiber power amplifier and splitter, from which mutually phase locked optical reference pulses as well as RF reference signals are derived. The former are directly transmitted to the pulsed laser and BAM clients over group delay stabilized fiber-optic links whereas the latter are transmitted via newly developed group delay stabilized radio-over-fiber (RoF) links. Both s- and c-band reference signals use s-band RoF links, whereupon the c-band receiver incorporates an additional ultra-low drift frequency doubler. Furthermore, ultra-low jitter analog laser phase lock loops have been built and digital ones are under development. We will present concepts and first results of sub-10fs rms jitter and 20fs peak-peak long term drift subsystems, as e.g. RoF links, tested in the SwissFEL injector test facility. | ||
![]() |
Slides MOCZB2 [2.372 MB] | |
Export • | reference for this paper to ※ LaTeX, ※ Text, ※ IS/RefMan, ※ EndNote (xml) | |
MOPF31 | Overview of Beam Instrumentation Activities for SwissFEL | 119 |
|
||
SwissFEL will provide users with brilliant X-ray pulses in 2017. A comprehensive suite of diagnostics is needed for the initial commissioning, for changes to the operating point, and for feedbacks. The development of instrumentation for SwissFEL is well underway, and solutions have been identified for most diagnostics systems. I will present here an overview of the instrumentation for SwissFEL, and give details on some recent developments. | ||
![]() |
Poster MOPF31 [4.418 MB] | |
Export • | reference for this paper to ※ LaTeX, ※ Text, ※ IS/RefMan, ※ EndNote (xml) | |
MOPD17 | Single-Shot Electro-Optical Diagnostics at the ANKA Storage Ring | 182 |
|
||
Funding: This work is funded by the BMBF contract numbers: 05K10VKC, 05K13VKA. ANKA is the first storage ring in the world with a near-field single-shot electro-optical (EO) bunch profile monitor. The method of electro-optical spectral decoding (EOSD) uses the Pockels effect to modulate the longitudinal electron bunch profile onto a long, chirped laser pulse passing through an EO crystal. The laser pulse is then analyzed with a single-shot spectrometer and from the spectral modulation, the temporal distribution can be extracted. The setup is tuned to a sub-ps resolution (granularity) and can measure down to bunch lengths of 1.5 ps RMS for bunch charges as low as 30 pC. With this setup it is possible to study longitudinal beam dynamics (e. g. microbunching) occurring during ANKA's low-alpha-operation, an operation mode with longitudinally compressed bunches to generate coherent synchrotron radiation in the THz range. In addition to measuring the longitudinal bunch profile, long-ranging wake-fields trailing the electron bunch can also be studied, hinting bunch-bunch interactions. |
||
Export • | reference for this paper to ※ LaTeX, ※ Text, ※ IS/RefMan, ※ EndNote (xml) | |
TUCYB3 | SwissFEL Beam Profile Monitor | 259 |
|
||
We have developed a beam profile monitor that allows us to measure two-dimensional electron beam profiles for highly compressed electron bunches. Such bunches have plagued profile measurements in optical transition radiation monitors in the past, because coherent radiation entering the optical system has invalidated the images and even destroyed cameras. The present design makes use of a scintillating crystal, and directs coherent transition radiation away from the optical axis by careful choice of the angle. When observing Snell's law of refraction as well as the Scheimpflug imaging condition, a resolution better than the thickness of the scintillator can be achieved. We will present measurements performed at the SwissFEL Injector Test Facility and at the Linac Coherent Light Source. The high resolution and excellent sensitivity of this monitor make it ideal for installation in SwissFEL. | ||
![]() |
Slides TUCYB3 [42.624 MB] | |
Export • | reference for this paper to ※ LaTeX, ※ Text, ※ IS/RefMan, ※ EndNote (xml) | |