TY - CPAPER
AU - Ischebeck, R.
AU - Krejcik, P.
AU - Loos, H.
AU - Prat, E.
AU - Schlott, V.
AU - Thominet, V.G.
AU - Yan, M.
TI - SwissFEL Beam Profile Monitor
J2 - Proc. of IBIC2014
AB - We have developed a beam profile monitor that allows us to measure two-dimensional electron beam profiles for highly compressed electron bunches. Such bunches have plagued profile measurements in optical transition radiation monitors in the past, because coherent radiation entering the optical system has invalidated the images and even destroyed cameras. The present design makes use of a scintillating crystal, and directs coherent transition radiation away from the optical axis by careful choice of the angle. When observing Snell's law of refraction as well as the Scheimpflug imaging condition, a resolution better than the thickness of the scintillator can be achieved. We will present measurements performed at the SwissFEL Injector Test Facility and at the Linac Coherent Light Source. The high resolution and excellent sensitivity of this monitor make it ideal for installation in SwissFEL.
PB - JACoW
CY - Geneva, Switzerland
SP - 259
EP - 262
KW - radiation
KW - electron
KW - vacuum
KW - laser
KW - detector
DA - 2014/10
PY - 2014
SN - 978-3-95450-141-0
UR - http://jacow.org/IBIC2014/papers/tucyb3.pdf
ER -